Abstract: A determination unit 70 determines whether there is incident light, based on an output value from an integrating circuit 62, and generates a determinated signal indicating a determinated result. A control unit 80 controls charge accumulating portions of an imaging light-receiving unit 10 whether or not to start accumulation of an electric charge, based on the determinated signal, and changes a charge accumulation capacitance value of the integrating circuit 62 of an output unit 60. Specifically, the control unit 80 varies the capacitance value for accumulation of an electric charge generated in a trigger light-receiving unit 20, depending upon the detection result on the presence/absence of incident light, to switch the sensitivity of the integrating circuit 62 to the trigger PD, thereby enabling optimal utilization of the trigger PD.

Abstract: The present invention relates to a distortion detecting system and a distortion detecting method having a structure for efficiently detecting distortion of a projected image that is projected onto a projected surface by a projector. The distortion detecting system includes a photodetecting apparatus, and an analyzing apparatus. When a reference brightness image is projected onto the projected surface by the projector, the photodetecting apparatus forms the projected image on the projected surface onto the photosensitive surface of the photodetector, and outputs light intensity profile data that indicates a one-dimensional distribution of incident light intensity in each of a first direction and a second direction on an image for inspection formed on the photosensitive surface.

Abstract: The present invention relates to, for example, an image pickup system having a structure capable of imaging a subject at a low power consumption and a low cost even when the subject may be dark. The image pickup system comprises an image pickup device, a peak position detecting section, a partial image acquiring section, and a partial image operating section. The image pickup device outputs image data that represents the two-dimensional intensity distribution of light incident on a photodetecting section, and outputs light intensity profile data that represents the one-dimensional intensity distribution of the incident light in each of first and second directions in the photodetecting section. The peak position detecting section detects a light intensity peak position in the two-dimensional intensity distribution of the light incident on the photodetecting section in the image pickup device, based on the light intensity profile data outputted from the image pickup device.

Abstract: A solid-state image pickup device 1 includes an imaging photodetecting section 10, a triggering photodetecting section 20, a row selecting section 30, a column selecting section 40, a voltage holding section 50, an output section 60, and a controlling section 70. The imaging photodetecting section 10 is for taking an image of incident light, and includes pixel sections P1,1 to PM,N arrayed two dimensionally in M rows and N columns. The triggering photodetecting section 20 is for detecting an incidence of light, and includes a triggering photodiode that generates electric charge of an amount according to an incident light intensity.

Abstract: A solid-state image pickup device 1 includes a light receiving section 10, a first row selecting section 20, a second row selecting section 30, a first readout section 40, a second readout section 50, and a control section 60. Data of pixel units of rows in the light receiving section 10 selected by the first row selecting section 20 are output by the first readout section 40 to obtain image pickup data, and further, data of the pixel units of rows in the light receiving section 10 selected by the second row selecting section 30 are output by the second readout section 50 to obtain communication data.

Abstract: A blinking-signal device 1 includes a light receiving section 10, a row selecting section 20, a readout section 30, a detecting section 40, and a control section 50. By the row selecting section 20, charge generated in its photodiode of each pixel unit P2i-1,n of the (2i?1)-th row in the light receiving section 10 is accumulated in its charge accumulating section during a first period, and charge generated in its photodiode of each pixel unit P2i,n of the 2i-th row in the light receiving section 10 is accumulated in its charge accumulating section during a second period. With the detecting section 40, it is detected whether or not light reaching the pixel units P2i-1,n and P2i,n is a blinking signal on the basis of a difference between data D2i-1,n and D2i,n of the pixel units P2i-1,n and P2i output from the readout section 30.

Abstract: There is provided a solid-state imaging device in which images can be read at high speed. Since an n-th processing circuit (e.g. PU1) can be connected to n-th pixel columns (N1) in respective imaging blocks B1, B2, and B3 via switches Q (1), Q (4), and Q (7), signals from the adjacent pixel columns (N2) are to be processed separately by another processing circuit (PU2) even when a partial readout area R may be small. In addition, an image data arithmetic section 10 specifies the partial readout area R restrictively, which allows for higher speed imaging.

Abstract: The solid-state image pickup device 1 includes an imaging region 10, a triggering photosensitive region 20, a row selecting section 30, a column selecting section 40, a voltage holding section 50, an output section 60, and a controlling section 70. The solid-state image pickup device 1 reads out triggering data by the triggering photosensitive region 20, the integrating circuit 62, and the triggering A/D converting circuit 64 before light incidence, and senses the light incidence on the basis of the triggering data. After the solid-state image pickup device senses the light incidence, the solid-state image pickup device reads out pixel data by the imaging region 10, the voltage holding section 50, a differential operating circuit 61, and an imaging A/D converting circuit 63.

Abstract: A solid-state imaging device 1 according to an embodiment of the present invention, in a solid-state imaging device for which M pixel units P(1) to P(16) for performing photoelectrical conversion are arrayed, includes N holding units H(1) to H(4) (N is smaller than M) that sequentially hold output signals from different pixel units out of the M pixel units P(1) to P(16), and an amplifying section 30 that sequentially amplifies output signals from the N holding units H(1) to H(4).

Abstract: A solid-state imaging device 1 according to an embodiment of the invention includes: pixel units P(x, y) each of which includes a photoelectric conversion element and an amplifying unit for a pixel unit and which are two-dimensionally arranged; at least one row of optical black units Pob(x, y) each of which includes a photoelectric conversion element, an amplifying unit for a pixel unit, and a light shielding film that covers the photoelectric conversion element, the photoelectric conversion element and the amplifying unit for a pixel unit being the same as those of the pixel unit P(x, y); and at least one row of optical gray units Pog(x, y) each of which includes an amplifying unit for a pixel unit which is the same as that of the pixel unit and to which a reference voltage is input. The value of the reference voltage is less than the value of the output signal from the photoelectric conversion element in a saturated state.

Abstract: The present invention relates to a photo-detecting apparatus having a structure for enabling photodetection with high sensitivity and wide dynamic range. When light is incident on a pixel section of an active pixel-type within a photo-detecting section, a voltage value corresponding to the amount of an electric charge generated at a photodiode included in the pixel section is outputted from the pixel section by way of a selecting transistor. A first pixel data readout section outputs the output from the pixel section as a first voltage value. On the other hand, the electric charge generated at the photodiode including the pixel section is outputted from the pixel section by way of a discharging transistor. The electric charge flown in a second pixel data readout section via a switch is accumulated in a capacitive element, and a voltage value corresponding to the amount of the accumulated electric charge is outputted from the second pixel data readout section as a second voltage value.

Abstract: The present invention relates to a photo-detecting apparatus capable of obtaining the intensity distribution of incident light at the same timing even when the intensity distribution of incident light may change with time. The photo-detecting apparatus comprises a photo-detecting section in which plural pixels are arranged in a two-dimensional array, and a signal processing section. Each of plural pixels constituting the photo-detecting section has a first photodiode and a second photodiode, N first photodiodes included in the group of pixels constituting the m-th row of the two-dimensional array being electrically connected to each other through multiple lines, while M second photodiodes included in the group of pixels constituting the n-th column of the two-dimensional array being electrically connected to each other through other multiple lines.

Abstract: An encoder calculates an absolute value of an operating angle of a scale plate. The scale plate includes light relay portions formed along an operational direction ? in the scale plate with a pattern of a one-dimensional array of optically transparent portions and optically nontransparent portions. The encoder identifies the light relay portion formed on a light receiving region, based on second light intensity profile data VY(m), and by using the patterns of optically transparent and optically nontransparent portions as codes. The position of a light relay portion can be accurately retrieved using reference positions for each light relay portion in the scale plate. The encoder calculates a center-of-gravity position of the identified light relay portion relative to a reference position in the light receiving region, based on first light intensity profile VX(n), and calculates an operating angle of the scale plate from the center-of-gravity position.

Abstract: A solid-state imaging device 1 is provided with (1) a photodetecting section 11 in which M×N of pixels are two-dimensionally arranged in M rows and N columns, and a pixel Pm,n at the m-th row and the n-th column includes a photodiode PD1m,n, (2) a row selecting section 20 that selects one or more rows, out of M rows of the photodetecting section 11, instructs each pixel in the selected rows to accumulate an electric charge generated in the photodiode PD1m,n in response to the incidence of light, and instructs to output data corresponding to the amount of accumulated electric charge of each pixel by each row of the photodetecting section 11, and (3) a first signal processing section 30 that inputs data of each pixel, outputted by each row of the photodetecting section 11 by an instruction from the row selecting section 20, and outputs the data by each pixel.

Abstract: There is provided a solid-state imaging device in which images can be read at high speed. Since an n-th processing circuit (e.g. PU1) can be connected to n-th pixel columns (N1) in respective imaging blocks B1, B2, and B3 via switches Q (1), Q (4), and Q (7), signals from the adjacent pixel columns (N2) are to be processed separately by another processing circuit (PU2) even when a partial readout area R may be small. In addition, an image data arithmetic section 10 specifies the partial readout area R restrictively, which allows for higher speed imaging.

Abstract: The present invention relates to an encoder capable of detecting an absolute value of an angle of rotation or the like of a target to be measured by a simple configuration with high accuracy. In the encoder, a photodetecting region of a photodetecting device and regions to be detected arranged on a scale plate satisfy a relational expression of W/2<D<W provided that a width of a photodetecting region is defined as W and arrangement pitches of the regions to be detected alternately arranged on two lines are defined as D. In this relationship, at least one of two regions to be detected adjacent to each other is always at a position overlapping the photodetecting region.

Abstract: A pixel section Pm,n includes a photodiode PD, a first capacitance section C1, a second capacitance section C2, and transistors T1-T6. The transistor T1 transfers the electric charge generated by the photodiode PD to the first capacitance section C1. The transistor T2 transfers the electric charge generated by the photodiode PD to the second capacitance section C2. The amplification transistor T3 outputs a voltage value corresponding to the amount of electric charge accumulated in the first capacitance section C1. The transistor T4 selectively outputs to the wiring L1,n the voltage value outputted from the amplification transistor T3. The transistors T3 and T4 constitute a source follower circuit. The transistors T5 and T6 selectively output to the wiring L2,n the electric charge accumulated in each of the first capacitance section C1 and the second capacitance section C2.

Abstract: The solid-state image pickup device 1 includes an imaging region 10, a triggering photosensitive region 20, a row selecting section 30, a column selecting section 40, a voltage holding section 50, an output section 60, and a controlling section 70. The solid-state image pickup device 1 reads out triggering data by the triggering photosensitive region 20, the integrating circuit 62, and the triggering A/D converting circuit 64 before light incidence, and senses the light incidence on the basis of the triggering data. After the solid-state image pickup device senses the light incidence, the solid-state image pickup device reads out pixel data by the imaging region 10, the voltage holding section 50, a differential operating circuit 61, and an imaging A/D converting circuit 63.

Abstract: There is provided a solid-state imaging device suitable for taking and analyzing binary or multilevel images including a plurality of regions that are partitioned under a certain rule.

Abstract: A determination unit 70 determines whether there is incident light, based on an output value from an integrating circuit 62, and generates a determinated signal indicating a determinated result. A control unit 80 controls charge accumulating portions of an imaging light-receiving unit 10 whether or not to start accumulation of an electric charge, based on the determinated signal, and changes a charge accumulation capacitance value of the integrating circuit 62 of an output unit 60. Specifically, the control unit 80 varies the capacitance value for accumulation of an electric charge generated in a trigger light-receiving unit 20, depending upon the detection result on the presence/absence of incident light, to switch the sensitivity of the integrating circuit 62 to the trigger PD, thereby enabling optimal utilization of the trigger PD.