Patents by Inventor Yusuke Abe

Yusuke Abe has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11211226
    Abstract: The present disclosure provides a pattern cross-sectional shape estimation system which includes a charged particle ray device which includes a scanning deflector that scans a charged particle beam, a detector that detects charged particles, and an angle discriminator that is disposed in a front stage of the detector and discriminates charged particles to be detected, and an arithmetic device that generates a luminance of an image, and calculates a signal waveform of a designated region on the image using the luminance. The arithmetic device generates angle discrimination images using signal electrons at different detection angles, and estimates a side wall shape of a measurement target pattern.
    Type: Grant
    Filed: March 6, 2020
    Date of Patent: December 28, 2021
    Assignee: HITACHI HIGH-TECH CORPORATION
    Inventors: Toshiyuki Yokosuka, Hirohiko Kitsuki, Daisuke Bizen, Makoto Suzuki, Yusuke Abe, Kenji Yasui, Mayuka Osaki, Hideyuki Kazumi
  • Publication number: 20210384006
    Abstract: When focus adjustment is performed according to the height of the surface of a sample at each inspection point in order to continuously inspect a plurality of inspection points on a wafer by using an electron microscope, even when the focus adjustment by an electrostatic lens in which a variation of heights of inspection points is greater than a predetermined range, and that can perform adjustment at a high speed and adjustment by an electromagnetic lens with a low speed are required to be used together, a flow of focus adjustment in which the number of times of the adjustment by the electromagnetic lens is reduced by using a relation of changes of heights at inspection points, an inspection order, and a range in which an electrostatic focus can be performed is realized, so that inspection with high throughput is made possible.
    Type: Application
    Filed: June 3, 2021
    Publication date: December 9, 2021
    Inventors: Takeyoshi Ohashi, Hyejin Kim, Yusuke Abe, Kenji Tanimoto
  • Patent number: 11164720
    Abstract: To measure a depth of a three-dimensional structure, for example, a hole or a groove, formed in a sample without preparing information in advance, an electron microscope detects, among emitted electrons generated by irradiating a sample with a primary electron beam, an emission angle in a predetermined range, the emission angle being formed between an axial direction of the primary electron beam and an emission direction of the emitted electrons, and outputs a detection signal corresponding to the number of the emitted electrons detected. An emission angle distribution of a detection signal is obtained based on a plurality of detection signals, and an opening angle is obtained based on a change point of the emission angle distribution, the opening angle being based on an optical axis direction of the primary electron beam with respect to the bottom portion of the three-dimensional structure.
    Type: Grant
    Filed: January 21, 2020
    Date of Patent: November 2, 2021
    Assignee: HITACHI HIGH-TECH CORPORATION
    Inventors: Kenji Yasui, Mayuka Osaki, Makoto Suzuki, Hirohiko Kitsuki, Toshiyuki Yokosuka, Daisuke Bizen, Yusuke Abe
  • Patent number: 11135512
    Abstract: An information processing apparatus in which a player plays a game by controlling a player character is provided. The information processing apparatus includes a memory, and a processor coupled to the memory and configured to generate a game image in accordance with an operation by the player, generate another image of another character or an object other than the player character, in a case where the another character or the object is in a state to be affected by the player character in the game, and superimpose and display the another image on the game image.
    Type: Grant
    Filed: May 26, 2020
    Date of Patent: October 5, 2021
    Assignee: KOEI TECMO GAMES CO., LTD.
    Inventors: Yusuke Abe, Mikihiro Shiozuru, Sho Hiroshige
  • Publication number: 20210272770
    Abstract: Provided is a scanning electron microscope which can perform high-speed focus correction even when an electron beam having high energy is used. The scanning electron microscope includes an electron optical system including an electron source 100 that emits an electron beam and an objective lens 113, a sample stage 1025 which is disposed on a stage 115 and on which a sample 114 is placed, a backscattered electron detector 1023 which is disposed between the objective lens and the sample stage and is configured to detect backscattered electrons 1017 emitted due to interaction between the electron beam and the sample, a backscattered electron detection system control unit 138 which is provided corresponding to the backscattered electron detector and is configured to apply a voltage to the backscattered electron detector, and a device control calculation device 146.
    Type: Application
    Filed: July 2, 2018
    Publication date: September 2, 2021
    Inventors: Yasunari SOHDA, Kaori BIZEN, Yusuke ABE, Kenji TANIMOTO
  • Patent number: 11096532
    Abstract: A vacuum cleaner is provided with a cleaner main body having an electric blower and a handle. The handle is shaped such that a gravity center position of the cleaner main body remains substantially unchanged in a state in which any one region is gripped.
    Type: Grant
    Filed: January 25, 2019
    Date of Patent: August 24, 2021
    Assignee: Toshiba Lifestyle Products & Services Corporation
    Inventors: Yusuke Abe, Yukio Machida, Fumiki Mano, Naoko Shinagawa, Takayoshi Shimizu
  • Publication number: 20210173634
    Abstract: The present invention realizes control program update even when the difference data is large. In the present invention, when updating the program, by controlling the amount of data to be received according to the capacity of the area of the vehicle control device storing the difference data, the vehicle control device sequentially performs restoration and update from the received partial data even if not all the difference data are stored.
    Type: Application
    Filed: February 1, 2019
    Publication date: June 10, 2021
    Applicant: Hitachi Automotive Systems, Ltd.
    Inventors: Fumiharu NAKAHARA, Kenichi KUROSAWA, Yusuke ABE
  • Publication number: 20210131801
    Abstract: To implement a calibration sample by which an incident angle can be measured with high accuracy, an electron beam adjustment method, and an electron beam apparatus using the calibration sample.
    Type: Application
    Filed: August 25, 2017
    Publication date: May 6, 2021
    Inventors: Yasunari SOHDA, Yoshinori NAKAYAMA, Kaori BIZEN, Hiroya OHTA, Yusuke ABE
  • Publication number: 20210043420
    Abstract: A scanning electron microscope includes an electron-optical system including an electron source and an objective lens, a stage on which a sample is placed, a secondary electron detector disposed adjacent to the electron source relative to the objective lens and configured to detect secondary electrons, a backscattered electron detector disposed between the objective lens and the stage and configured to detect backscattered electrons, a backscattered electron detection system controller configured to apply a voltage to the backscattered electron detector, and a device-control computer configured to detect a state of an electrical charge carried by the backscattered electron detector based on signal intensity at the secondary electron detector when the primary electrons are applied to the sample with a predetermined voltage applied to the backscattered electron detector.
    Type: Application
    Filed: July 29, 2020
    Publication date: February 11, 2021
    Inventors: Takeyoshi Ohashi, Yusuke Abe, Kenji Tanimoto, Kaori Bizen, Hyejin Kim
  • Publication number: 20200386789
    Abstract: A clamped object is reliably clamped. A clamp sensor includes a pair of clamp arms that are formed so as to be substantially arc-shaped in plan view, that are configured so that at least one of the clamp arms is rotatable so that respective front ends of the clamp arms open and close, and that form a ring-shaped body in a state where the front ends are closed. Front end portions of the clamp arms have a pair of facing surfaces that construct the outer circumferential surface and the inner circumferential surface of the ring-shaped body, a pair of facing surfaces that construct two side surfaces of the ring-shaped body, a pair of facing surfaces that are inclined to the facing surfaces, and a pair of facing surfaces that are inclined to the facing surfaces.
    Type: Application
    Filed: February 1, 2019
    Publication date: December 10, 2020
    Applicant: HIOKI E.E. CORPORATION
    Inventors: Kentaro NAKAJIMA, Tetsuya NAKAMURA, Takeaki MIYAZAWA, Yusuke ABE
  • Publication number: 20200376380
    Abstract: An information processing apparatus in which a player plays a game by controlling a player character is provided. The information processing apparatus includes a memory, and a processor coupled to the memory and configured to generate a game image in accordance with an operation by the player, generate another image of another character or an object other than the player character, in a case where the another character or the object is in a state to be affected by the player character in the game, and superimpose and display the another image on the game image.
    Type: Application
    Filed: May 26, 2020
    Publication date: December 3, 2020
    Inventors: Yusuke ABE, Mikihiro SHIOZURU, Sho HIROSHIGE
  • Publication number: 20200321189
    Abstract: The present disclosure provides a pattern cross-sectional shape estimation system which includes a charged particle ray device which includes a scanning deflector that scans a charged particle beam, a detector that detects charged particles, and an angle discriminator that is disposed in a front stage of the detector and discriminates charged particles to be detected, and an arithmetic device that generates a luminance of an image, and calculates a signal waveform of a designated region on the image using the luminance. The arithmetic device generates angle discrimination images using signal electrons at different detection angles, and estimates a side wall shape of a measurement target pattern.
    Type: Application
    Filed: March 6, 2020
    Publication date: October 8, 2020
    Inventors: Toshiyuki YOKOSUKA, Hirohiko KITSUKI, Daisuke BIZEN, Makoto SUZUKI, Yusuke ABE, Kenji YASUI, Mayuka OSAKI, Hideyuki KAZUMI
  • Publication number: 20200309627
    Abstract: A physical quantity measuring device includes: a metallic cylindrical case; a sensor module configured to detect a physical quantity; a synthetic-resin joint provided near a first open end of the cylindrical case, the joint being attached with the sensor module and provided with an introduction port for introducing a measurement target fluid; and a cover provided near a second open end of the cylindrical case. The cover includes a locking portion for locking the sensor module. The cylindrical case includes an engagement portion provided near the first open end and engaged with the joint and a crimp portion provided near the second open end, the crimp portion configured to be plastically deformed by crimping. The cover is attached to the cylindrical case by crimping the crimp portion.
    Type: Application
    Filed: March 20, 2020
    Publication date: October 1, 2020
    Inventors: Yusuke Abe, Shuji Tohyama, Haruhiko Sekiya
  • Patent number: 10789184
    Abstract: In the present invention, computational efficiency degradation is suppressed when diagnosing a shared storage area in a vehicle control device in which a plurality of computing units are employed. This vehicle control device suppresses computational efficiency degradation by changing an access destination in a storage device while diagnosing a shared storage area that the storage device has.
    Type: Grant
    Filed: October 26, 2016
    Date of Patent: September 29, 2020
    Assignee: Hitachi Automotive Systems, Ltd.
    Inventors: Tsunamichi Tsukidate, Yusuke Abe, Takeshi Fukuda, Tomohito Ebina, Fumio Narisawa
  • Publication number: 20200278615
    Abstract: The present invention comprises a computation device for measuring the dimensions of patterns formed on a sample on the basis of a signal obtained from a charged particle beam device. The computation device comprises a positional deviation amount calculation unit for calculating the amount of positional deviation in a direction parallel to a wafer surface between two patterns having different heights on the basis of an image acquired at a given beam tilt angle; a pattern inclination amount calculation unit for calculating an amount of pattern inclination from the amount of positional deviation using a predetermined relational expression for the amount of positional deviation and the amount of pattern inclination; and a beam tilt control amount calculation unit for controlling the beam tilt angle so as to match the amount of pattern inclination. The pattern measurement device sets the beam tilt angle to a calculated beam tilt angle, reacquires an image and measures the patterns.
    Type: Application
    Filed: October 13, 2017
    Publication date: September 3, 2020
    Inventors: Takuma YAMAMOTO, Hiroya OHTA, Kenji TANIMOTO, Yusuke ABE, Tomohiro TAMORI, Masaaki NOJIRI
  • Publication number: 20200234916
    Abstract: To measure a depth of a three-dimensional structure, for example, a hole or a groove, formed in a sample without preparing information for each pattern or calibration in advance. The invention provides an electron microscope including a detection unit that detects, among emitted electrons generated from a sample by irradiating the sample with a primary electron beam, emitted electrons of which an emission angle is in a predetermined range, the emission angle being an angle formed between an axial direction of the primary electron beam and an emission direction of the emitted electrons from the sample, and outputs a detection signal corresponding to the number of the emitted electrons which are detected.
    Type: Application
    Filed: January 21, 2020
    Publication date: July 23, 2020
    Inventors: Kenji YASUI, Mayuka OSAKI, Makoto SUZUKI, Hirohiko KITSUKI, Toshiyuki YOKOSUKA, Daisuke BIZEN, Yusuke ABE
  • Publication number: 20200183349
    Abstract: An electronic control unit for vehicle capable of receiving a program by communication expands the received program in a volatile memory and executes the expanded program. As an example of this program, there is a program for changing a communication environment for communicating with another unit.
    Type: Application
    Filed: February 12, 2020
    Publication date: June 11, 2020
    Inventors: Yusuke ABE, Koji YUASA, Toshihisa ARAI
  • Patent number: 10636618
    Abstract: There is provided a charged particle beam apparatus including: a charged particle source; a condenser lens and an object lens for converging a charged particle beam from the charged particle source and irradiating the converged charged particle beam to a specimen; and plural image shift deflectors for deflecting the charged particle beam. In the charged particle beam apparatus, the deflection of the charged particle beam is controlled using first control parameters that set the optical axis of a charged particle beam to a first optical axis that passes through the center of the object lens and enters a predefined position of the specimen, and second control parameters that transform the first control parameters so that the first control parameters set the optical axis of the charged particle beam to a second optical axis having a predefined incident angle different from the incident angle of the first optical axis.
    Type: Grant
    Filed: August 28, 2018
    Date of Patent: April 28, 2020
    Assignee: HITACHI HIGH-TECHNOLOGIES CORPORATION
    Inventors: Kaori Bizen, Yasunari Sohda, Makoto Sakakibara, Hiroya Ohta, Kenji Tanimoto, Yusuke Abe
  • Patent number: 10606229
    Abstract: An electronic control unit for vehicle capable of receiving a program by communication expands the received program in a volatile memory and executes the expanded program. As an example of this program, there is a program for changing a communication environment for communicating with another unit.
    Type: Grant
    Filed: September 14, 2012
    Date of Patent: March 31, 2020
    Assignee: Hitachi Automotive Systems, Ltd.
    Inventors: Yusuke Abe, Koji Yuasa, Toshihisa Arai
  • Publication number: 20190339963
    Abstract: The present invention enhances the security of program update. In addition, the present invention simplifies program version control. The present invention includes: a decompression and restoration unit that, when differential data between a new execution program and a specific program is input, decompresses and restores the compressed specific program and rewrites the execution program as the specific program; and a differential restoration unit that differentially restores the new execution program from the differential data and the specific program and rewrites the specific program as the new execution program.
    Type: Application
    Filed: March 15, 2018
    Publication date: November 7, 2019
    Applicant: HITACHI AUTOMOTIVE SYSTEMS, LTD.
    Inventors: Kenichi KUROSAWA, Fumiharu NAKAHARA, Yusuke ABE