Abstract: The present disclosure provides an apparatus and system for testing a touch screen, and an apparatus for controlling test of a touch screen. The apparatus for testing a touch screen comprises: a processor, a test signal collection interface unit, and an external communication interface unit, wherein the processor is connected to the test signal collection interface unit, and is configured to, after touch information is collected by the test signal collection interface unit, convert the collected touch information into a format which is recognizable by an intelligent device, and transmit the converted touch information to the intelligent device through the external communication interface unit. The apparatus for testing a touch screen according to the present disclosure enables the touch information to be correspondingly processed and displayed by a processor and a display of the intelligent device, respectively.

Abstract: A color parameter measurement device and a color parameter measurement method are provided. A display light beam from a to-be-tested display panel is split by a beam-splitting assembly into at least testing light beams corresponding to a light-beam-in-first-color filter, a light-beam-in-second-color filter and a light-beam-in-third-color filter respectively. Next, a light-beam-in-first-color component, a light-beam-in-second-color component and a light-beam-in-third-color component of the corresponding testing light beams are transmitted to corresponding receivers through the corresponding filters. Then, the light-beam-in-first-color component, the light-beam-in-second-color component and the light-beam-in-third-color component are converted into electric signals by the corresponding receivers, and then outputted to a processor for color parameter analysis.

Abstract: An optical parameter measurement device and a corresponding method are provided. A light beam from a to-be-tested display panel is split by a beam-splitting assembly into at least two testing light beams. A voltage value corresponding to a first testing light beam is measured by a trans-impedance amplification circuit corresponding to a first optical sensor. Next, an integration time period is determined by a control circuit according to voltage values from the trans-impedance amplification circuit and a predetermined relational model between voltage values corresponding to the light intensities and integration time periods. A voltage value corresponding to a second testing light beam is finely measured by the integration circuit corresponding to a second optical sensor within the integration time period. Finally, the display brightness value of the to-be-tested display panel is determined by the control circuit according to a voltage value from the integration circuit within the integration time period.

Abstract: A heated inlet guide vane is disclosed. The disclosed guide vane may include a body having an inlet cavity disposed alongside of an outlet cavity wherein the outlet cavity is disposed alongside the leading edge of the vane. The inlet cavity is in communication with a source of heated air. The inlet cavity is in communication with the outlet cavity by way of a plurality of impingement holes spaced along the inner wall disposed between the two cavities. Bleed holes are spaced along the length of the outlet cavity. Fresh, heated air enters the outlet cavity along the entire length of the outlet cavity and quickly exits the outlet cavity with minimal cooling so that a uniform d-icing capability is provided along the entire leading edge of the inlet guide vane.

Abstract: A method for forming a capacitor, a capacitor formed thereby and an improved composition for a conductive coating are described. The method includes providing an anode, forming a dielectric on the anode and forming a cathode layer over the dielectric by applying a monoamine, a weak acid and a conductive polymer.

Abstract: An embodiment of the present disclosure provides a backlight detection device, comprising: a carrier plate, having a backlight detection region for carrying a backlight to be detected; a light property detection plate with a plurality of brightness sensors arranged thereon, configured for detecting light properties of different regions of a backlight to be detected which is positioned in the backlight detection region; and a data processing unit, in signal connection with the plurality of brightness sensors, configured for judging whether the light property of the backlight to be detected is qualified or not according to a plurality of brightness signals of different regions of the light source to be detected which are detected by the plurality of brightness sensors.

Abstract: A method of forming a semiconductor device includes the following steps. A substrate is provided, and the substrate has a first region. A barrier layer is then formed on the first region of the substrate. A first work function layer is formed on the barrier layer. An upper half portion of the first work function layer is converted into a non-volatile material layer. The non-volatile material layer is removed and a lower half portion of the first work function layer is kept.

Abstract: A method for fabricating semiconductor device is disclosed. The method includes the steps of: providing a substrate; forming a first organic layer on the substrate; patterning the first organic layer to form an opening; forming a second organic layer in the opening; and removing the first organic layer to form a patterned second organic layer on the substrate.

Abstract: An electronic device which is protected against screen breakage when dropped includes a display panel defining a through hole, a gravity sensor, a processor, and a bumper deployment mechanism. The bumper deployment mechanism includes a first elastic part and a connected rotating mechanism. The rotating mechanism includes a motor. The processor can compare a detected acceleration value with a preset acceleration value. When the detected acceleration value represents free-fall motion, which is greater than the preset acceleration value, the processor controls the motor to drive the first elastic part to pass through the through hole of the display panel and protrude from the display panel as a shock absorber.

Abstract: A method of forming a semiconductor device includes the following steps. A substrate is provided, and the substrate has a first region. A barrier layer is then formed on the first region of the substrate. A first work function layer is formed on the barrier layer. An upper half portion of the first work function layer is converted into a non-volatile material layer. The non-volatile material layer is removed and a lower half portion of the first work function layer is kept.

Abstract: A memory cleaning method and apparatus, and a terminal device are provided. The memory cleaning method includes: acquiring information about application processes that occupy memory of a terminal device; determining, according to behavior characteristic information of using an application by a user, that a first application process in the application processes is an application process for which cleaning is not performed; and performing memory cleaning processing on an application process, except the first application process, in the application processes, so that it may be implemented that memory cleaning is performed according to the behavior characteristic information of using an application by the user and operating performance of the terminal device is improved. Furthermore a response time required when the user starts the first application process again is reduced, and an experience effect of using the terminal device by the user is ensured.

Abstract: A fixture for display module inspection is disclosed. The fixture includes a base, a lower rotatable body pivotally mounted on the base, a middle rotatable body hinged with the lower rotatable body, an upper rotatable body hinged with the middle rotatable body and a carrier fixedly connected to the upper rotatable body for carrying a display module. A rotation axis of the lower rotatable body and a rotation axis of the middle rotatable body are arranged orthogonally to each other, the rotation axis of the middle rotatable body and a rotation axis of the upper rotatable body are arranged orthogonally to each other. Rotation position locking mechanisms are respectively provided between the lower rotatable body and the base, between the middle rotatable body and the lower rotatable body, and between the upper rotatable body and the middle rotatable body.

Abstract: A semiconductor device and a method of forming the same, the semiconductor device include a substrate, and a first gate structure and a second gate structure disposed on the substrate. The first gate structure includes a barrier layer, a first work function layer, a second work function layer and a conductive layer stacked one over another on the substrate. The second gate structure includes the barrier layer, a portion of the first work function layer and the conductive layer stacked one over another on the substrate, wherein the portion of the first work function layer has a smaller thickness than a thickness of the first work function layer.

Abstract: The present disclosure provides a data transmission method and a terminal. The method includes respectively allocating, by a terminal, a first download range and a second download range to a first network interface card and a second network interface card according to an obtained download range of to-be-downloaded data; and if the terminal determines that when a preset download time arrives, the first network interface card completes downloading of the first download range and the second network interface card does not complete downloading of the second download range, performing, by the terminal, a first allocation operation at least once. This reduces download duration of to-be-downloaded data.

Abstract: A method for forming a capacitor, a capacitor formed thereby and an improved composition for a conductive coating are described. The method includes providing an anode, forming a dielectric on the anode and forming a cathode layer over the dielectric by applying a monoamine, a weak acid and a conductive polymer.

Abstract: A semiconductor device and a method of forming the same, the semiconductor device include a substrate, and a first gate structure and a second gate structure disposed on the substrate. The first gate structure includes a barrier layer, a first work function layer, a second work function layer and a conductive layer stacked one over another on the substrate. The second gate structure includes the barrier layer, a portion of the first work function layer and the conductive layer stacked one over another on the substrate, wherein the portion of the first work function layer has a smaller thickness than a thickness of the first work function layer.

Abstract: A method for fabricating semiconductor device is disclosed. The method includes the steps of: providing a substrate; forming a first organic layer on the substrate; patterning the first organic layer to form an opening; forming a second organic layer in the opening; and removing the first organic layer to form a patterned second organic layer on the substrate.

Abstract: A method for forming a capacitor, a capacitor formed thereby and an improved composition for a conductive coating are described. The method includes providing an anode, forming a dielectric on the anode and forming a cathode layer over the dielectric by applying a monoamine, a weak acid and a conductive polymer.

Abstract: A method for forming a capacitor, a capacitor formed thereby and an improved composition for a conductive coating are described. The method includes providing an anode, forming a dielectric on the anode and forming a cathode layer over the dielectric by applying an amine, a weak acid and a conductive polymer.

Abstract: A master device, a slave device, and methods are disclosed. The method is performed by a first slave device connected to a master-slave tree network, comprising: determining whether a beacon has not been received within a predetermined time period; and distributing a first beacon to a second slave device if no beacon has been received within the predetermined time period; wherein for the first slave device to remain in the master-slave-network, a beacon be received by the first slave device within the predetermined time period.