SEMICONDUCTOR DEVICE HAVING 3D INDUCTOR AND METHOD OF MANUFACTURING THE SAME
A semiconductor device having 3D inductor includes a first transverse inductor, a longitudinal inductor and a second transverse inductor. The first transverse inductor is formed on a first substrate, the second transverse inductor and the longitudinal inductor are formed on a second substrate. The second substrate is bonded to the first substrate to connect the first transverse inductor and the longitudinal inductor such that the first transverse inductor, the longitudinal inductor and the second transverse inductor compose a 3D inductor.
This invention relates to a semiconductor device, and more particularly to a semiconductor device having 3D inductor.
BACKGROUND OF THE INVENTIONConventionally, 2D inductors are formed on a substrate of a semiconductor device. Increasing the size of the 2D inductors is required for sufficient inductance, but that also increase the size of the semiconductor device. For this reason, 2D inductors are incapable of meeting size requirements of miniaturized semiconductor device.
SUMMARYThe object of the present invention is to provide a semiconductor device having 3D inductor. Radial transverse inductors on two different substrates are connected with each other by a longitudinal inductor to form a 3D inductor.
A semiconductor device having 3D inductor of the present invention includes a first substrate, a first transverse inductor, a longitudinal inductor, a second transverse inductor and a second substrate. The first substrate includes a first conductive pad and a second conductive pad. The first transverse inductor is located on the first substrate and includes a plurality of first inductor portions. The first inductor portions are arranged on the first substrate radially and each include a first exterior end and a first interior end. One of the first inductor portions is connected to the first conductive pad, and another one of the first inductor portions is connected to the second conductive pad. The longitudinal inductor is located on the first transverse inductor and includes a supportive layer and a plurality of exterior inductor portions and interior inductor portions. The supportive layer includes a plurality of exterior openings and interior openings, the exterior and interior inductor portions are located in the exterior and interior openings, respectively. The second transverse inductor is located on the longitudinal inductor and includes an insulation layer and a plurality of second inductor portions. The insulation layer includes a plurality of openings arranged radially. The second inductor portions are located in the openings, arranged radially and each include a second exterior end and a second interior end. Both ends of each of the exterior inductor portions are connected to the first exterior end of the first inductor portions and the second exterior end of the second inductor portions, respectively. Both ends of each of the interior inductor portions are connected to the first interior end of the first inductor portions and the second interior end of the second inductor portions, respectively. The exterior and interior inductor portions connected to the same second inductor portion are connected to two of the adjacent first inductor portions, respectively. The second substrate is located on the second transverse inductor.
A method of manufacturing a semiconductor device having 3D inductor of the present invention includes steps of: forming a first transverse inductor on a first substrate, the first substrate includes a first conductive pad and a second conductive pad, the first transverse inductor includes a plurality of first inductor portions which are arranged on the first substrate radially and each include a first exterior end and a first interior end, one of the first inductor portions is connected to the first conductive pad, and another one of the first inductor portions is connected to the second conductive pad; forming a second transverse inductor on a second substrate, the second transverse inductor includes an insulation layer and a plurality of second inductor portions, the insulation layer is formed on the second substrate and includes a plurality of openings arranged radially, the second inductor portions are formed in the openings, arranged radially and each include a second exterior end and a second interior end; forming a longitudinal inductor on the second transverse inductor, the longitudinal inductor includes a supportive layer and a plurality of exterior inductor portions and interior inductor portions, the supportive layer is formed on the second transverse inductor and includes a plurality of exterior openings and interior openings, the second exterior ends and the second interior ends of the second inductor portions are exposed by the exterior openings and the interior openings, respectively, the exterior inductor portions are formed in the exterior openings to connect to the second exterior end of the second inductor portions, and the interior inductor portions are formed in the interior openings to connect to the second interior end of the second inductor portions; and bonding the longitudinal inductor and the first transverse inductor, the exterior and interior inductor portions are connected to the first exterior end and first interior end of the first inductor portions, respectively; and the exterior and interior inductor portions connected to the same second inductor portion are connected to two of the adjacent first inductor portions, respectively.
In the present invention, the first transverse inductor is formed on the first substrate, the second transverse inductor and the longitudinal inductor are formed on the second substrate. Through bonding the longitudinal inductor and the first transverse inductor, the first transverse inductor, the longitudinal inductor and the second transverse inductor compose a 3D inductor which has a higher inductance because of cross-section area increment.
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In other embodiments, the supportive layer 630 is formed by stacking two layers of dry film photoresist. First layer is applied to the second transverse inductor 500, the exterior inductor portions 610 and the interior inductor portions 620 are formed through photoresist patterning and metal deposition processes. Next, second layer is applied to the first layer and photoresist patterning and metal deposition processes are performed again such that the exterior inductor portions 610 formed in two layers are connected with each other and the interior inductor portions 620 formed in two layers are also connected with each other.
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When the longitudinal inductor 600 is bonded to the first transverse inductor 200 by the solder layer 700, each of the exterior bonding portions 710 is configured to connect the exterior inductor portion 610 and the first exterior end 211 of the first inductor portion 210 (as shown in
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In this embodiment, the first substrate 100 and the second substrate 400 are a circuit chip and a silicon wafer, respectively. A plurality of second transverse inductors 500 and longitudinal inductors 600 are formed on the silicon wafer. Through grinding and sawing processes, the silicon wafer becomes a plurality of units having one second transverse inductor 500 and one longitudinal inductor 600. The semiconductor device having 3D inductor is formed by bonding the longitudinal inductor 600 to the first transverse inductor 200.
The longitudinal inductor on one substrate is bonded to the transverse inductor arranged on another substrate radially to form the 3D inductor through semiconductor bonding process such that miniaturized semiconductor device can have higher inductance.
While this invention has been particularly illustrated and described in detail with respect to the preferred embodiments thereof, it will be clearly understood by those skilled in the art that is not limited to the specific features shown and described and various modified and changed in form and details may be made without departing from the spirit and scope of this invention.
Claims
1. A semiconductor device, comprising:
- a first substrate including a first conductive pad and a second conductive pad;
- a first transverse inductor located on the first substrate and including a plurality of first inductor portions, the first inductor portions are arranged on the first substrate radially and each include a first exterior end and a first interior end, wherein one of the first inductor portions is connected to the first conductive pad, and another one of the first inductor portions is connected to the second conductive pad;
- a longitudinal inductor located on the first transverse inductor and including a supportive layer, a plurality of exterior inductor portions and a plurality of interior inductor portions, the supportive layer includes a plurality of exterior openings and a plurality of interior openings, the exterior and interior inductor portions are located in the exterior and interior openings, respectively;
- a second transverse inductor located on the longitudinal inductor and including an insulation layer and a plurality of second inductor portions, the insulation layer includes a plurality of openings arranged radially, the second inductor portions are located in the openings, arranged radially and each include a second exterior end and a second interior end, wherein both ends of each of the exterior inductor portions are connected to the first exterior end of the first inductor portions and the second exterior end of the second inductor portions, respectively, both ends of each of the interior inductor portions are connected to the first interior end of the first inductor portions and the second interior end of the second inductor portions, respectively, and the exterior and interior inductor portions connected to the same second inductor portion are connected to two of the adjacent first inductor portions, respectively; and
- a second substrate located on the second transverse inductor.
2. The semiconductor device in accordance with claim 1, wherein two of the adjacent first inductor portions are connected to the first and second conductive pads, respectively.
3. The semiconductor device in accordance with claim 1, wherein two of the adjacent first inductor portions are connected to the first and second conductive pads, respectively, through the first exterior end.
4. The semiconductor device in accordance with claim 1, wherein an intersection of the first and second inductor portions connected to the same exterior inductor portion defines a first overlap area, an intersection of the first and second inductor portions connected to the same interior inductor portion defines a second overlap area, and the first overlap area is larger than the second overlap area.
5. The semiconductor device in accordance with claim 1, wherein a width of the first exterior end is larger than a width of the first interior end, and a width of the second exterior end is larger than a width of the second interior end.
6. The semiconductor device in accordance with claim 1, wherein a distance between the first exterior ends of two of the adjacent first inductor portions is larger than a distance between the first interior ends of two of the adjacent first inductor portions.
7. The semiconductor device in accordance with claim 1, wherein a height of the exterior inductor portions is substantially equal to a height of the interior inductor portions and higher than a height of the second inductor portions.
8. The semiconductor device in accordance with claim 1 further comprising a solder layer including a plurality of exterior bonding portions and a plurality of interior bonding portions, wherein the exterior bonding portions are connected to the exterior inductor portions and the first exterior end of the first inductor portions, and the interior bonding portions are connected to the interior inductor portions and the first interior end of the first inductor portions.
9. The semiconductor device in accordance with claim 1 further comprising a protective layer located between the first substrate and the longitudinal inductor and including a plurality of first exposing openings and a plurality of second exposing openings, wherein the first exterior end and the first interior end of the first inductor portions are exposed by the first exposing openings and the second exposing openings, respectively.
10. A method of manufacturing a semiconductor device, comprising:
- forming a first transverse inductor on a first substrate, the first substrate includes a first conductive pad and a second conductive pad, the first transverse inductor includes a plurality of first inductor portions which are formed on the first substrate radially and each include a first exterior end and a first interior end, wherein one of the first inductor portions is connected to the first conductive pad and another one of the first inductor portions is connected to the second conductive pad;
- forming a second transverse inductor on a second substrate, the second transverse inductor includes an insulation layer and a plurality of second inductor portions, the insulation layer is formed on the second substrate and includes a plurality of openings arranged radially; the second inductor portions are formed in the openings, arranged radially and each include a second exterior end and a second interior end;
- forming a longitudinal inductor on the second transverse inductor, the longitudinal inductor includes a supportive layer, a plurality of exterior inductor portions and a plurality of interior inductor portions, the supportive layer is formed on the second transverse inductor and includes a plurality of exterior openings and a plurality of interior openings, the second exterior end and the second interior end of the second inductor portions are exposed by the exterior openings and the interior openings, respectively, the exterior inductor portions are formed in the exterior openings to connect to the second exterior end of the second inductor portions, and the interior inductor portions are formed in the interior openings to connect to the second interior end of the second inductor portions; and
- bonding the longitudinal inductor and the first transverse inductor, the exterior inductor portions and the interior inductor portions are connected to the first exterior end and the first interior end of the first inductor portions, respectively, wherein the exterior and interior inductor portions connected to the same second inductor portion are connected to two of the adjacent first inductor portions, respectively.
11. The manufacturing method in accordance with claim 10, wherein two of the adjacent first inductor portions are connected to the first and second conductive pads, respectively.
12. The manufacturing method in accordance with claim 10, wherein two of the adjacent first inductor portions are connected to the first and second conductive pads, respectively, through the first exterior end.
13. The manufacturing method in accordance with claim 10, wherein an intersection of the first and second inductor portions connected to the same exterior inductor portion defines a first overlap area, an intersection of the first and second inductor portions connected to the same interior inductor portion defines a second overlap area, and the first overlap area is larger than the second overlap area.
14. The manufacturing method in accordance with claim 10, wherein a width of the first exterior end is larger than a width of the first interior end, and a width of the second exterior end is larger than a width of the second interior end.
15. The manufacturing method in accordance with claim 10, wherein a distance between the first exterior ends of two of the adjacent first inductor portions is larger than a distance between the first interior ends of two of the adjacent first inductor portions.
16. The manufacturing method in accordance with claim 10, wherein a height of the exterior inductor portions is substantially equal to a height of the interior inductor portions and higher than a height of the second inductor portions.
17. The manufacturing method in accordance with claim 10, wherein a solder layer is formed on the longitudinal inductor after forming the longitudinal inductor, the solder layer includes a plurality of exterior bonding portions and a plurality of interior bonding portions, wherein when bonding the longitudinal inductor and the first transverse inductor, the exterior bonding portions are configured to connect the exterior inductor portions and the first exterior end of the first inductor portions, and the interior bonding portions are configured to connect the interior inductor portions and the first interior end of the first inductor portions.
18. The manufacturing method in accordance with claim 10, wherein a protective layer is formed on the first transverse inductor after forming the first transverse inductor, the protective layer includes a plurality of first exposing openings and a plurality of second exposing openings, the first exterior end and the first interior end of the first inductor portions are exposed by the first exposing openings and the second exposing openings, respectively.
Type: Application
Filed: May 2, 2019
Publication Date: Aug 20, 2020
Inventors: Cheng-Hung Shih (Changhua County), Nian-Cih Yang (Hsinchu County), Yi-Cheng Chen (Taoyuan City), Shang-Jan Yang (New Taipei City)
Application Number: 16/401,736