Test lead
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Description
The broken lines in the figures illustrate portions of the test lead in which the design is embodied that form no part of the claimed design.
Claims
The ornamental design for a test lead, as shown and described.
Referenced Cited
Patent History
Patent number: D1016642
Type: Grant
Filed: Mar 17, 2022
Date of Patent: Mar 5, 2024
Assignee: FLUKE CORPORATION (Everett, WA)
Inventor: Wei Liu (Shanghai)
Primary Examiner: Antoine Duval Davis
Application Number: 29/831,182
Type: Grant
Filed: Mar 17, 2022
Date of Patent: Mar 5, 2024
Assignee: FLUKE CORPORATION (Everett, WA)
Inventor: Wei Liu (Shanghai)
Primary Examiner: Antoine Duval Davis
Application Number: 29/831,182
Classifications
Current U.S. Class:
Element Or Attachment (4) (D10/80)