Electrical test probe

- Tektronix, Inc.
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Description

FIG. 1 is a perspective view of an electrical test probe showing our new design;

FIG. 2 is a left side elevational view thereof, the right side elevational view being a mirror image;

FIG. 3 is a top plan view thereof;

FIG. 4 is a bottom plan view thereof;

FIG. 5 is a front elevational view thereof; and,

FIG. 6 is a rear elevational view thereof.

Referenced Cited
U.S. Patent Documents
D162813 April 1951 Goldberger et al.
D300909 May 2, 1989 Thornburg et al.
D311346 October 16, 1990 Gross
4673300 June 16, 1987 Wilhelmson et al.
Other references
  • Tektronix, Inc., Tek Accessories; Minature Modular Passive Probes; Subminiature Passive Probes; etc.: .COPYRGT.1989; pp. 4, 6, 8, 10, 12, 14, 18-20, 24. Tegam Inc., Thermocouple Probes, Aug. 1987; cover page.
Patent History
Patent number: D334147
Type: Grant
Filed: Jun 13, 1990
Date of Patent: Mar 23, 1993
Assignee: Tektronix, Inc. (Wilsonville, OR)
Inventors: Glen Aukstikalnis (Vancouver, WA), Mark Nightingale (Camas, WA)
Primary Examiner: Alan P. Douglas
Assistant Examiner: Antoine Davis
Attorney: William K. Bucher
Application Number: 7/538,941
Classifications
Current U.S. Class: Element Or Attachment (4) (D10/80)