Probe pin for integrated circuit testing

Skip to: Description  ·  Claims  ·  References Cited  · Patent History  ·  Patent History
Description

1.1 : Perspective

1.2 : Front

1.3 : Back

1.4 : Left

1.5 : Right

1.6 : Top

1.7 : Bottom

Claims

The ornamental design for a probe pin for integrated circuit testing as shown and described.

Referenced Cited
U.S. Patent Documents
5499933 March 19, 1996 Sekine
D422230 April 4, 2000 Johnston
7116121 October 3, 2006 Holcombe
D764330 August 23, 2016 Teranishi
D847757 May 7, 2019 Nasu
D1090440 August 26, 2025 Treibergs
20020113612 August 22, 2002 Nguyen
20050030050 February 10, 2005 Jung
20100285698 November 11, 2010 Lee
20110034093 February 10, 2011 Hirano
20110117796 May 19, 2011 Oishi
20110248736 October 13, 2011 Kato
20160072202 March 10, 2016 Hemmi
20180348256 December 6, 2018 Hwang
20190317128 October 17, 2019 Hwang
20240280608 August 22, 2024 Hwang
20250251422 August 7, 2025 Choi
Foreign Patent Documents
112303480 July 2024 TW
113303695 April 2025 TW
113303696 April 2025 TW
113303697 April 2025 TW
113303699 April 2025 TW
Other references
  • Harwin two part probe, posted Jul. 21, 2017 [online], [retrieved Mar. 11, 2026]. Retrieved from internet, https://www.digikey.com/en/products/detail/harwin-inc/P25-4021/3924416?gclsrc=aw.ds&gad_source=1&gad_campaignid=20228387720&gclid=EAlalQobChMludn9w_CXkwMVQG1HAR0pcitEAQYASABEgKdqPD_BwE (Year: 2017).
  • HiCon hi-contact hr-contact pins, posted Apr. 18, 2025 [online], [retrieved xx/xx/xx]. Retrieved from internet, https://www.hi-con.kr/pin (Year: 2025).
  • Omron blade pin, posted Jun. 25, 2022 [online], [retrieved Mar. 11, 2026]. Retrieved from internet, https://components.omron.com/eu-en/solutions/efc-sockets-and-probe-pins-for-ic-testing (Year: 2022).
  • Omron high density probe pin, posted Jul. 1, 2013 [online], [retrieved Mar. 11, 2026]. Retrieved from internet, hhttps://www.omron.com/media/press/2013/07/e0701.html (Year: 2013).
  • PeakTest spring contact test probes, posted Dec. 9, 2023 [online], [retrieved Mar. 11, 2026]. Retrieved from internet, https://www.peaktest.co.uk/resources/technical-how-guides/what-spring-contacttest-probe (Year: 2023).
  • Plastronics H Pin YouTube, posted Jun. 15, 2020 [online], [retrieved Mar. 11, 2026]. Retrieved from internet, https://www.youtube.com/watch?v=48OIBqsS5HU&t=76s (Year: 2020).
  • Sfeng high current test probe pin, posted Mar. 11, 2026 [online], [retrieved Mar. 11, 2026]. Retrieved from internet, https://www.sfcontactprobe.com/High-current-testprobesclips/25a-sf12-7-5-high-current-test-probepin (Year: 2026).
  • Tek Crown stamped spring probe, posted Jul. 20, 2019 [online], [retrieved Mar. 11, 2026]. Retrieved from internet, https://tekcrown.com/stamped-spring-probe/ (Year: 2019).
  • UPT one-piece contact pin, posted Nov. 26, 2024 [online], [retrieved Mar. 11, 2026]. Retrieved from internet, https://upt-co.com/en/product/semiconductor-test/u-contact/ (Year: 2024).
Patent History
Patent number: D1127742
Type: Grant
Filed: Jul 17, 2024
Date of Patent: May 26, 2026
Inventors: Dong Weon Hwang (Seongnam-si), Jae Baek Hwang (Seongnam-si), Logan Jae Hwang (Beverly Hills, CA)
Primary Examiner: George D. Kirschbaum
Assistant Examiner: Denis Houyoux
Application Number: 35/525,876
Classifications
Current U.S. Class: Element Or Attachment (D13/154)