Analytical instrument system

- IBM
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Description

FIG. 1 is a front right perspective of our analytical instrument system embodied as a film thickness analyzer;

FIG. 2 is a front left perspective of the system of FIG. 1;

FIG. 3 is a back elevation of the system of FIG. 1;

FIG. 4 is a top view of the system of FIG. 1;

FIG. 5 is a front right perspective of our analytical instrument system embodied as a color analyzer for textiles.

The rear of the second embodiment is identical to the rear of the first as shown in FIG. 3.

Referenced Cited
U.S. Patent Documents
D218434 August 1970 Graham et al.
D225645 December 1972 Bixler et al.
D233759 November 1974 Pycha et al.
D234600 March 1975 Giancarlo
Other references
  • I.B.M. System/360 Summary, File No. S360-00, 1966, p. 19, Inquiry Display Terminal.
Patent History
Patent number: D248098
Type: Grant
Filed: Oct 2, 1975
Date of Patent: Jun 6, 1978
Assignee: International Business Machines Corporation (Armonk, NY)
Inventors: Eugene N. Giancarlo (Wappingers Falls, NY), James J. Ladue (Wappingers Falls, NY)
Primary Examiner: Susan J. Lucas
Attorney: William S. Robertson
Application Number: 5/619,105
Classifications
Current U.S. Class: D14/40
International Classification: D1402;