Micrometer

- Mitutoyo Mfg. Co., Ltd.
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Description

FIG. 1 is a perspective view of a micrometer showing our new design;

FIG. 2 is a front elevational view thereof;

FIG. 3 is a top plan view thereof;

FIG. 4 is a rear elevational view thereof;

FIG. 5 is a left-side elevational view thereof;

FIG. 6 is a right-side elevational view thereof; and

FIG. 7 is a bottom plan view thereof.

Referenced Cited
U.S. Patent Documents
D198710 July 1964 Hinmelsbach
D239704 April 1976 Morgan
D253689 December 18, 1979 Tanada
D254655 April 8, 1980 Brickwood
3608201 September 1971 Butsch
4168575 September 25, 1979 Sugizaki
Other references
  • Alina Catalog No. IN-200-2 Instrument Div., p. 7-Diac Micrometer at center.
Patent History
Patent number: D263809
Type: Grant
Filed: Oct 11, 1979
Date of Patent: Apr 13, 1982
Assignee: Mitutoyo Mfg. Co., Ltd. (Tokyo)
Inventors: Hiroaki Suwa (Hiromachi), Kiyohiro Nakata (Hiromachi)
Primary Examiner: Nelson C. Holtje
Law Firm: Koda and Androlia
Application Number: 6/83,626
Classifications
Current U.S. Class: Micrometer, Caliper Or Divider Type (D10/73)
International Classification: D1004;