Micrometer

- Mitutoyo Mfg. Co., Ltd.
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Description

FIG. 1 is a perspective view of a micrometer showing my new design;

FIG. 2 is a front elevational view thereof;

FIG. 3 is a rear elevational view thereof;

FIG. 4 is a left-side elevational view thereof;

FIG. 5 is a right-side elevational view thereof;

FIG. 6 is a top plan view thereof; and

FIG. 7 is a bottom plan view thereof.

Referenced Cited
U.S. Patent Documents
D239704 April 1976 Morgan
D254655 April 8, 1980 Brickwood
D263809 April 13, 1982 Suwa
3608201 September 1971 Butsch
3845564 November 1974 Morgan
4168575 September 25, 1979 Sugizaki
Other references
  • Alina Cat. No. IN-200-2 Instrument Div.-p. 7, Micrometer.
Patent History
Patent number: D268740
Type: Grant
Filed: Apr 2, 1981
Date of Patent: Apr 26, 1983
Assignee: Mitutoyo Mfg. Co., Ltd. (Tokyo)
Inventor: Tetsunori Tanada (Hiroshima)
Primary Examiner: Nelson C. Holtje
Law Firm: Koda and Androlia
Application Number: 6/250,103
Classifications
Current U.S. Class: Micrometer, Caliper Or Divider Type (D10/73)
International Classification: D1004;