Integrated circuit tester

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Description

FIG. 1 is a top plan view of an integrated circuit tester showing our new design;

FIG. 2 is a front elevational view;

FIG. 3 is a rear elevational view;

FIG. 4 is a right side elevational view, the hinged keyboard shown extended;

FIG. 5 is a left side elevational view, the hinged keyboard shown extended;

FIG. 6 is a bottom plan view;

FIG. 7 is another right side elevational view, the hinged keyboard shown in the closed position;

FIG. 8 is another left side elevational view, the hinged keyboard shown in the closed position; and,

FIG. 9 is a top, front and right side perspective view thereof.

Referenced Cited
U.S. Patent Documents
D255116 May 27, 1980 MacDonald et al.
D289292 April 14, 1987 Ansell et al.
D299910 February 21, 1989 Doman et al.
4517512 May 14, 1985 Petrich et al.
4528504 July 9, 1985 Thornton, Jr. et al.
4532423 July 30, 1985 Tojo et al.
4616178 October 7, 1986 Thornton, Jr. et al.
4669053 May 26, 1987 Krenz
4703858 November 3, 1987 Ueberreiter et al.
4829241 May 9, 1989 Maelzer
Patent History
Patent number: D308645
Type: Grant
Filed: Feb 26, 1987
Date of Patent: Jun 19, 1990
Assignee: John Fluke Mfg. Co., Inc. (Everett, WA)
Inventors: Cheryl A. Hughes (Seattle, WA), Edmond C. Eng (Lynnwood, WA)
Primary Examiner: Bruce W. Dunkins
Assistant Examiner: Antoine D. Davis
Attorneys: Mikio Ishimaru, Stephen A. Becker
Application Number: 7/19,603
Classifications
Current U.S. Class: Electrical Property (D10/75); D14/100; D14/106