Multiple point digital stimulus/response probe

- John Fluke Mfg. Co., Inc.
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Description

FIG. 1 is a top plan view of a multiple point digital stimulus/response probe showing our new design;

FIG. 2 is a front elevational view;

FIG. 3 is a right side elevational view;

FIG. 4 is a left side elevational view;

FIG. 5 is a rear elevational view; and

FIG. 6 is a bottom plan view thereof.

Referenced Cited
U.S. Patent Documents
D281401 November 19, 1985 Perrins
1412376 April 1922 Stoller
3757216 September 1973 Kurtin et al.
3757218 September 1973 Oliverio et al.
4330287 May 18, 1982 Babcock
4524320 June 18, 1985 Brooks
Patent History
Patent number: D311146
Type: Grant
Filed: Feb 26, 1987
Date of Patent: Oct 9, 1990
Assignee: John Fluke Mfg. Co., Inc. (Everett, WA)
Inventors: Cheryl A. Hughes (Seattle, WA), Chung K. Liu (Seattle, WA)
Primary Examiner: Nelson C. Holtje
Assistant Examiner: Antoine D. Davis
Attorneys: Stephen A. Becker, Mikio Ishimaru
Application Number: 7/19,548
Classifications
Current U.S. Class: Electrical Property (D10/75)