Electronic thermometer probe
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Description
FIG. 1 is a front elevational view of an electronic thermometer probe showing our new design;
FIG. 2 is a top plan view, the bottom plan view being identical;
FIG. 3 is a rear elevational view;
FIG. 4 is a left side elevational view;
FIG. 5 is a right side elevational view; and
FIG. 6 is a cross-sectional view taken along line 6--6 of FIG. 1 thereof.
Referenced Cited
U.S. Patent Documents
D218850 | September 1970 | Sato |
D223050 | March 1972 | Sato |
D227801 | July 1973 | Oudewaal |
D249126 | August 29, 1978 | Pitstick et al. |
D250753 | January 9, 1979 | Turner et al. |
D260084 | August 4, 1981 | Asano |
D300909 | May 2, 1989 | Thornberg et al. |
2579376 | December 1951 | Falk |
2844031 | July 1958 | Rosenthal |
4349031 | September 14, 1982 | Perlin |
4752770 | June 21, 1988 | St. Pierce |
Patent History
Patent number: D311689
Type: Grant
Filed: Feb 5, 1988
Date of Patent: Oct 30, 1990
Assignee: Terumo Kabushiki Kaisha (Tokyo)
Inventors: Tetsuya Ide (Fujinomiya), Kenichi Kida (Tokyo)
Primary Examiner: Nelson C. Holtje
Assistant Examiner: Antoine D. Davis
Law Firm: Oblon, Spivak, McClelland, Maier & Neustadt
Application Number: 7/152,579
Type: Grant
Filed: Feb 5, 1988
Date of Patent: Oct 30, 1990
Assignee: Terumo Kabushiki Kaisha (Tokyo)
Inventors: Tetsuya Ide (Fujinomiya), Kenichi Kida (Tokyo)
Primary Examiner: Nelson C. Holtje
Assistant Examiner: Antoine D. Davis
Law Firm: Oblon, Spivak, McClelland, Maier & Neustadt
Application Number: 7/152,579
Classifications
Current U.S. Class:
Element Or Attachment (4) (D10/60)