Electronic thermometer probe

- Terumo Kabushiki Kaisha
Description

FIG. 1 is a front elevational view of an electronic thermometer probe showing our new design;

FIG. 2 is a top plan view, the bottom plan view being identical;

FIG. 3 is a rear elevational view;

FIG. 4 is a left side elevational view;

FIG. 5 is a right side elevational view; and

FIG. 6 is a cross-sectional view taken along line 6--6 of FIG. 1 thereof.

Referenced Cited
U.S. Patent Documents
D218850 September 1970 Sato
D223050 March 1972 Sato
D227801 July 1973 Oudewaal
D249126 August 29, 1978 Pitstick et al.
D250753 January 9, 1979 Turner et al.
D260084 August 4, 1981 Asano
D300909 May 2, 1989 Thornberg et al.
2579376 December 1951 Falk
2844031 July 1958 Rosenthal
4349031 September 14, 1982 Perlin
4752770 June 21, 1988 St. Pierce
Patent History
Patent number: D311689
Type: Grant
Filed: Feb 5, 1988
Date of Patent: Oct 30, 1990
Assignee: Terumo Kabushiki Kaisha (Tokyo)
Inventors: Tetsuya Ide (Fujinomiya), Kenichi Kida (Tokyo)
Primary Examiner: Nelson C. Holtje
Assistant Examiner: Antoine D. Davis
Law Firm: Oblon, Spivak, McClelland, Maier & Neustadt
Application Number: 7/152,579
Classifications