Electron microscope
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Description
FIG. 1 is a front, top and right side perspective view of an Electron Microscope showing our new design;
FIG. 2 is a front elevational view thereof;
FIG. 3 is a top plan view thereof;
FIG. 4 is a bottom plan view thereof;
FIG. 5 is a right side view therof;
FIG. 6 is a left side view therof;
FIG. 7 is a rear elevational view thereof; and,
FIG. 8 is a front, top and right side perspective view of an Electron Microscope in condition of usage, it being understood that the broken line showing of environment is for illustrative purposes only and forms no part of the claimed design.
Referenced Cited
Patent History
Patent number: D381031
Type: Grant
Filed: Jul 27, 1995
Date of Patent: Jul 15, 1997
Assignee: Hitachi, Ltd. (Tokyo)
Inventors: Tomoyuki Miyata (Mitaka), Atsushi Katayama (Kokubunji), Daiji Tsuboi (Kodaira), Hiroyuki Kobayashi (Mito), Hisashi Sato (Hitachinaka), Sadao Terakado (Hitachinaka), Peter Hohmann (Kirchseeon)
Primary Examiner: James M. Gandy
Assistant Examiner: Stacia Sinuik
Law Firm: Antonelli, Terry, Stout & Kraus
Application Number: 0/41,935
Type: Grant
Filed: Jul 27, 1995
Date of Patent: Jul 15, 1997
Assignee: Hitachi, Ltd. (Tokyo)
Inventors: Tomoyuki Miyata (Mitaka), Atsushi Katayama (Kokubunji), Daiji Tsuboi (Kodaira), Hiroyuki Kobayashi (Mito), Hisashi Sato (Hitachinaka), Sadao Terakado (Hitachinaka), Peter Hohmann (Kirchseeon)
Primary Examiner: James M. Gandy
Assistant Examiner: Stacia Sinuik
Law Firm: Antonelli, Terry, Stout & Kraus
Application Number: 0/41,935
Classifications