Ring for use in a semiconductor wafer heat processing apparatus
Latest Tokyo Electron Limited Patents:
- Detection device and detection method
- Ignition condition calculation method and plasma processing apparatus
- Device and method of forming 3D U-shaped nanosheet cfet
- Apparatus and method for determining the surface profile of a semiconductor substrate using a laser scanning technique
- Plasma processing apparatus, power source system, and plasma processing method
Description
FIG. 1 a perspective view of a ring for use in a semiconductor wafer heat processing apparatus;
FIG. 2 a top plan view thereof;
FIG. 3 a front elevational view thereof;
FIG. 4 a bottom plan view thereof;
FIG. 5 a right side view thereof;
FIG. 6 a rear elevational view thereof; and,
FIG. 7 a cross-sectional view taken along line VII--VII in FIG. 3.
Referenced Cited
Patent History
Patent number: D404372
Type: Grant
Filed: Feb 12, 1998
Date of Patent: Jan 19, 1999
Assignee: Tokyo Electron Limited (Tokyo-To)
Inventor: Katsutoshi Ishii (Shiroyama-machi)
Primary Examiner: Brian N. Vinson
Law Firm: Ladas & Parry
Application Number: 0/83,715
Type: Grant
Filed: Feb 12, 1998
Date of Patent: Jan 19, 1999
Assignee: Tokyo Electron Limited (Tokyo-To)
Inventor: Katsutoshi Ishii (Shiroyama-machi)
Primary Examiner: Brian N. Vinson
Law Firm: Ladas & Parry
Application Number: 0/83,715
Classifications
Current U.S. Class:
Semiconductor, Transistor Or Integrated Circuit (24) (D13/182)
International Classification: 1303;
International Classification: 1303;