Wafer pod
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Description
FIG. 1 is a perspective view of a wafer pod showing the preferred embodiment of my new design;
FIG. 2 is a front elevational view of the wafer pod;
FIG. 3 is a rear elevational view of the wafer pod;
FIG. 4 is a left elevational side view of the wafer pod;
FIG. 5 is a right elevational side view of the wafer pod;
FIG. 6 is a top plan view of the wafer pod; and,
FIG. 7 is a bottom plan view of the wafer pod.
Referenced Cited
U.S. Patent Documents
D344891 | March 8, 1994 | Dressen |
D376688 | December 24, 1996 | Gallagher et al. |
D387903 | December 23, 1997 | Jacoby et al. |
4588086 | May 13, 1986 | Coe |
4684021 | August 4, 1987 | Niebling et al. |
4709834 | December 1, 1987 | Mortensen et al. |
4793488 | December 27, 1988 | Mortensen |
4817799 | April 4, 1989 | Gregerson et al. |
5025926 | June 25, 1991 | Gregerson et al. |
5207324 | May 4, 1993 | Kos |
Patent History
Patent number: D408139
Type: Grant
Filed: Aug 12, 1997
Date of Patent: Apr 20, 1999
Assignee: Industrial Technology Research Institute (Hsinchu)
Inventors: Horng-Kuang Fan (Hsinchu), Gwo-Jou Huang (Hsinchu)
Primary Examiner: Philip S. Hyder
Attorney: W. Wayne Liauh
Application Number: 0/77,908
Type: Grant
Filed: Aug 12, 1997
Date of Patent: Apr 20, 1999
Assignee: Industrial Technology Research Institute (Hsinchu)
Inventors: Horng-Kuang Fan (Hsinchu), Gwo-Jou Huang (Hsinchu)
Primary Examiner: Philip S. Hyder
Attorney: W. Wayne Liauh
Application Number: 0/77,908
Classifications
Current U.S. Class:
D/3273;
D3/269
International Classification: 0301;
International Classification: 0301;