Clamp tester

- Kaise Kabushiki Kaisha
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Description

FIG. 1 is a perspective view of a clamp tester showing my new design;

FIG. 2 is a front elevational view thereof;

FIG. 3 is a rear elevational view thereof;

FIG. 4 is a left side elevational view thereof;

FIG. 5 is a right side elevational view thereof;

FIG. 6 is a top plan view thereof;

FIG. 7 is a bottom plan view thereof; and,

FIG. 8 is a front elevational view indicating a clamp-open status.

Referenced Cited
U.S. Patent Documents
RE36227 June 1999 Arnoux
D345704 April 5, 1994 Shirai
D396657 August 4, 1998 Nagai et al.
Foreign Patent Documents
61-30771 February 1986 JPX
Patent History
Patent number: D419467
Type: Grant
Filed: Apr 12, 1999
Date of Patent: Jan 25, 2000
Assignee: Kaise Kabushiki Kaisha (Nagano-ken)
Inventors: Hideo Kaise (Ueda), Etsuo Shirai (Ueda)
Primary Examiner: Antoine Duval Davis
Law Firm: Jordan and Hamburg LLP
Application Number: 0/103,258
Classifications
Current U.S. Class: Clamp-around Type (D10/79)
International Classification: 1004;