Circuit tester
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Description
FIG. 1 is a plane view of a circuit tester showing my new design;
FIG. 2 is a front elevational view thereof;
FIG. 3 is a rear elevational view of thereof
FIG. 4 is a bottom plane view thereof;
FIG. 5 is a left side elevational view thereof;
FIG. 6 is a right side elevational view thereof;
FIG. 7 is a plane view, in which the testing rod is separated from the main body section; and,
FIG. 8 is a perspective elevational view thereof.
Claims
The ornamental design for a circuit tester, as shown and described.
Referenced Cited
Patent History
Patent number: D460702
Type: Grant
Filed: Apr 9, 2001
Date of Patent: Jul 23, 2002
Assignee: Kaise Kabushiki Kaisha (Nagano)
Inventor: Hideo Kaise (Ueda)
Primary Examiner: Antoine Duval Davis
Attorney, Agent or Law Firm: Jordan and Hamburg LLP
Application Number: 29/139,954
Type: Grant
Filed: Apr 9, 2001
Date of Patent: Jul 23, 2002
Assignee: Kaise Kabushiki Kaisha (Nagano)
Inventor: Hideo Kaise (Ueda)
Primary Examiner: Antoine Duval Davis
Attorney, Agent or Law Firm: Jordan and Hamburg LLP
Application Number: 29/139,954
Classifications