Circuit tester

- Kaise Kabushiki Kaisha
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Description

FIG. 1 is a plane view of a circuit tester showing my new design;

FIG. 2 is a front elevational view thereof;

FIG. 3 is a rear elevational view of thereof

FIG. 4 is a bottom plane view thereof;

FIG. 5 is a left side elevational view thereof;

FIG. 6 is a right side elevational view thereof;

FIG. 7 is a plane view, in which the testing rod is separated from the main body section; and,

FIG. 8 is a perspective elevational view thereof.

Claims

The ornamental design for a circuit tester, as shown and described.

Referenced Cited
U.S. Patent Documents
D260618 September 8, 1981 Koslar
D288179 February 10, 1987 Sekido
D289617 May 5, 1987 Yajima
D367431 February 27, 1996 Omuro et al.
D400454 November 3, 1998 Arnoux et al.
Patent History
Patent number: D460702
Type: Grant
Filed: Apr 9, 2001
Date of Patent: Jul 23, 2002
Assignee: Kaise Kabushiki Kaisha (Nagano)
Inventor: Hideo Kaise (Ueda)
Primary Examiner: Antoine Duval Davis
Attorney, Agent or Law Firm: Jordan and Hamburg LLP
Application Number: 29/139,954
Classifications
Current U.S. Class: Provided With Handle, Or Hand-held (D10/78)
International Classification: 1004;