Electrostatic chuck with improved spacing mask and workpiece detection device
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Description
FIG. 1 is a top view of the electrostatic chuck with the improved spacing mask and workpiece detection device;
FIG. 2 is an elevation view of the electrostatic chuck when looking down along the y-axis of FIG. 1;
FIG. 3 is a detailed view of part of the electrostatic chuck seen in FIG. 2;
FIG. 4 is a bottom view of the electrostatic chuck;
FIG. 5 is an elevation view of the electrostatic chuck when looking up along the y-axis of FIG. 1;
FIG. 6 is an elevation view of the electrostatic chuck when looking to the left along the x-axis of FIG. 1; and,
FIG. 7 is an elevation view of the electrostatic chuck when looking to the right along the x-axis in FIG. 1.
Referenced Cited
Patent History
Patent number: D420023
Type: Grant
Filed: Jan 9, 1999
Date of Patent: Feb 1, 2000
Assignee: Applied Materials, Inc. (Santa Clara, CA)
Inventors: Allen Flanigan (San Jose, CA), Steven Sansoni (Tracy, CA), Vincent E. Burkhart (San Jose, CA)
Primary Examiner: Antoine Duval Davis
Law Firm: Thomason, Moser & Patterson
Application Number: 0/98,986
Type: Grant
Filed: Jan 9, 1999
Date of Patent: Feb 1, 2000
Assignee: Applied Materials, Inc. (Santa Clara, CA)
Inventors: Allen Flanigan (San Jose, CA), Steven Sansoni (Tracy, CA), Vincent E. Burkhart (San Jose, CA)
Primary Examiner: Antoine Duval Davis
Law Firm: Thomason, Moser & Patterson
Application Number: 0/98,986
Classifications