Microscope

- Nikon
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Description

FIG. 1 is a front elevational view of a microscope showing our new design;

FIG. 2 is a left side elevational view thereof;

FIG. 3 is a rear elevational view thereof;

FIG. 4 is a right side elevational view thereof;

FIG. 5 is a top plan view thereof;

FIG. 6 is a bottom plan view thereof; and,

FIG. 7 is a front perspective view thereof.

Referenced Cited
U.S. Patent Documents
D345747 April 5, 1994 Holbl
D355430 February 14, 1995 Hofmann-Igl
D367869 March 12, 1996 Hofmann-Igl et al.
D391587 March 3, 1998 Hashimoto
2967456 January 1961 Maier
3512860 May 1970 Hanson et al.
3687520 August 1972 Nothnagle et al.
Patent History
Patent number: D423029
Type: Grant
Filed: Jun 15, 1999
Date of Patent: Apr 18, 2000
Assignee: Nikon Corporation (Tokyo)
Inventor: Nobuya Kawahata (Yokosuka)
Primary Examiner: Paula A. Mortimer
Law Firm: Oliff & Berridge, PLC
Application Number: 0/106,413
Classifications
Current U.S. Class: Microscope (D16/131)
International Classification: 1606;