Electrical probe
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Description
FIG. 1 is a perspective view of an embodiment of an electrical probe showing my new design;
FIG. 2 is a left side elevation view thereof;
FIG. 3 is a front elevation view thereof;
FIG. 4 is a top plan view thereof;
FIG. 5 is a rear elevation view thereof;
FIG. 6 is a right side elevation view thereof; and,
FIG. 7 is a bottom plan view thereof.
The broken line showing is for illustrative purposes only and forms no part of the claimed design.
Referenced Cited
Patent History
Patent number: D427922
Type: Grant
Filed: Oct 29, 1999
Date of Patent: Jul 11, 2000
Assignee: Fluke Corporation (Everett, WA)
Inventor: Christian Peter Suurmeijer (Amersfoort)
Primary Examiner: Antoine Duval Davis
Attorney: George T. Noe
Application Number: 0/113,166
Type: Grant
Filed: Oct 29, 1999
Date of Patent: Jul 11, 2000
Assignee: Fluke Corporation (Everett, WA)
Inventor: Christian Peter Suurmeijer (Amersfoort)
Primary Examiner: Antoine Duval Davis
Attorney: George T. Noe
Application Number: 0/113,166
Classifications