Notched electrical test probe tip
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FIG. 1 is a general perspective view of a notched electrical test probe tip showing the new design, wherein the broken line depiction of the shaft is included merely for illustrative purposes and forms no part of the claimed design.
FIG. 2 is a front view of the notched electrical test probe tip, the back view being a mirror image thereof, wherein the broken line depiction of the shaft is included merely for illustrative purposes and forms no part of the claimed design.
FIG. 3 is a right side view of the notched electrical test probe tip, the left side view being a mirror image thereof, wherein the broken line depiction of the shaft is included merely for illustrative purposes and forms no part of the claimed design.
FIG. 4 is a top view of the notched electrical test probe tip; and,
FIG. 5 is a bottom view of the notched electrical test probe tip.
Claims
The ornamental design for a notched electrical test probe tip, as shown and described.
Type: Grant
Filed: Jul 31, 2000
Date of Patent: Jul 10, 2001
Assignee: LeCroy Corporation (Beaverton, OR)
Inventor: Julie A. Campbell (Beaverton, OR)
Primary Examiner: Antoine Duval Davis
Attorney, Agent or Law Firm: Miller Nash LLP
Application Number: 29/127,137
