Probe thermometer

- Chaney Instrument Company
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Description

FIG. 1 is a perspective view of the probe thermometer showing our new design;

FIG. 2 is a right side elevation view of the probe thermometer shown in FIG. 1, the left side elevation view being a mirror image thereof;

FIG. 3 is a front elevation view of the probe thermometer of FIG. 1;

FIG. 4 is a top plan view of the probe thermometer shown in FIG. 1;

FIG. 5 is a bottom plan view of the probe thermometer shown in FIG. 1;

FIG. 6 is a back plan view of the probe thermometer shown in FIG. 1;

FIG. 7 is a perspective view of an alternate embodiment of the invention in which a portion of the probe of FIG. 1 is uncovered;

FIG. 8 is a perspective view of an alternate embodiment of the invention in which a portion of the probe of FIG. 1 is uncovered;

FIG. 9 is a right side elevation view of the probe thermometer of FIG. 7, with the left side elevation view being a mirror image thereof;

FIG. 10 is a front elevation view of the probe thermometer of FIG. 7;

FIG. 11 is a top plan view of the probe thermometer of FIG. 7; and,

FIG. 12 is a back elevation of the probe thermometer of FIG. 7.

Claims

The ornamental design for a probe thermometer, as shown.

Referenced Cited
U.S. Patent Documents
D236254 August 1975 Ray
D236814 September 1975 Sato
D257428 October 21, 1980 Manno
D268991 May 17, 1983 Bilgutay
D297819 September 27, 1988 Cacciatore
D439809 April 3, 2001 Ming et al.
Patent History
Patent number: D452178
Type: Grant
Filed: May 26, 2000
Date of Patent: Dec 18, 2001
Assignee: Chaney Instrument Company (Lake Geneva, WI)
Inventors: Ho Wai Ming (Tsing Lung Tau), Ronald J. Kovarsky (Highland Park, IL), Paul Mayer (Burlington, WI)
Primary Examiner: Antoine Duval Davis
Attorney, Agent or Law Firm: Michael Best & Friedrich, L.L.C.
Application Number: 29/123,913
Classifications
Current U.S. Class: Thermometer (D10/57)
International Classification: 1004;