Offset probe thermometer

Info

Patent number: D457078
Type: Grant
Filed: Mar 21, 2001
Date of Patent: May 14, 2002
Assignee: Chaney Instrument Company (Lake Geneva, WI)
Inventors: Patrick J. Devlin (Winthrop Harbor, IL), Patricia M. Koeppel (Kenosha, WI)
Primary Examiner: Antoine Duval Davis
Attorney, Agent or Law Firm: Michael Best & Friedrich, LLC
Application Number: 29/138,888

Description

Description

FIG. 1 is a front perspective view of the offset probe thermometer of the present invention;

FIG. 2 is a right side elevation view of the offset probe thermometer shown in FIG. 1, the left side elevation view being a mirror image thereof;

FIG. 3 is a front elevation view of the offset probe thermometer of FIG. 1;

FIG. 4 is a top plan view of the offset probe thermometer shown in FIG. 1;

FIG. 5 is a bottom plan view of the offset probe thermometer shown in FIG. 1; and,

FIG. 6 is a back plan view of the offset probe thermometer shown in FIG. 2.

Claims

The ornamental design for a offset probe thermometer, as shown.