Fork probe thermometer

- Chaney Instrument Company
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Description

FIG. 1 is a perspective view of a the fork probe thermometer showing our new design;

FIG. 2 is a right side elevation view of the fork probe thermometer shown in FIG. 1, the left side elevation view being a mirror image thereof;

FIG. 3 is a front elevation view of the fork probe thermometer of FIG. 1;

FIG. 4 is a top plan view of the fork probe thermometer shown in FIG. 1;

FIG. 5 is a bottom plan view of the fork probe thermometer shown in FIG. 1; and,

FIG. 6 is a back plan view of the fork probe thermometer shown in FIG. 1.

Claims

The ornamental design for a fork probe thermometer, as shown.

Referenced Cited
U.S. Patent Documents
D227294 June 1973 Maynard
3410457 November 1968 Brown
3552210 January 1971 Wright, Jr.
4332409 June 1, 1982 Stachowicz
Patent History
Patent number: D439809
Type: Grant
Filed: May 26, 2000
Date of Patent: Apr 3, 2001
Assignee: Chaney Instrument Company (Lake Geneva, WI)
Inventors: Ho Wai Ming (Tsing Lung Tan), Ronald J. Kovarsky (Highland Park, IL), Paul Mayer (Burlington, WI)
Primary Examiner: Terry A. Wallace
Attorney, Agent or Law Firm: Laff, Whitesel & Saret, Ltd.
Application Number: 29/123,934
Classifications
Current U.S. Class: D7/683; Thermometer (D10/57)
International Classification: 0702;