Fork probe thermometer
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Description
FIG. 1 is a perspective view of a the fork probe thermometer showing our new design;
FIG. 2 is a right side elevation view of the fork probe thermometer shown in FIG. 1, the left side elevation view being a mirror image thereof;
FIG. 3 is a front elevation view of the fork probe thermometer of FIG. 1;
FIG. 4 is a top plan view of the fork probe thermometer shown in FIG. 1;
FIG. 5 is a bottom plan view of the fork probe thermometer shown in FIG. 1; and,
FIG. 6 is a back plan view of the fork probe thermometer shown in FIG. 1.
Claims
The ornamental design for a fork probe thermometer, as shown.
Referenced Cited
U.S. Patent Documents
D227294 | June 1973 | Maynard |
3410457 | November 1968 | Brown |
3552210 | January 1971 | Wright, Jr. |
4332409 | June 1, 1982 | Stachowicz |
Patent History
Patent number: D439809
Type: Grant
Filed: May 26, 2000
Date of Patent: Apr 3, 2001
Assignee: Chaney Instrument Company (Lake Geneva, WI)
Inventors: Ho Wai Ming (Tsing Lung Tan), Ronald J. Kovarsky (Highland Park, IL), Paul Mayer (Burlington, WI)
Primary Examiner: Terry A. Wallace
Attorney, Agent or Law Firm: Laff, Whitesel & Saret, Ltd.
Application Number: 29/123,934
Type: Grant
Filed: May 26, 2000
Date of Patent: Apr 3, 2001
Assignee: Chaney Instrument Company (Lake Geneva, WI)
Inventors: Ho Wai Ming (Tsing Lung Tan), Ronald J. Kovarsky (Highland Park, IL), Paul Mayer (Burlington, WI)
Primary Examiner: Terry A. Wallace
Attorney, Agent or Law Firm: Laff, Whitesel & Saret, Ltd.
Application Number: 29/123,934
Classifications