Measurement instrument

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Description

FIG. 1 is a front elevational view of a first embodiment of the measurement instrument showing our new design;

FIG. 2 is a top plan view thereof;

FIG. 3 is a left side elevational view thereof;

FIG. 4 is a right side elevational view thereof;

FIG. 5 is a rear elevational view thereof; and,

FIG. 6 is a bottom plan view thereof.

The broken line showing is for illustrative purposes only and forms no part of the claimed design.

Claims

The ornamental design for the “measurement instrument,” as shown.

Referenced Cited
U.S. Patent Documents
6720776 April 13, 2004 Anderson et al.
20010001850 May 24, 2001 Miller
20030191591 October 9, 2003 Iiyoshi et al.
20030204342 October 30, 2003 Law et al.
Patent History
Patent number: D501414
Type: Grant
Filed: Oct 9, 2003
Date of Patent: Feb 1, 2005
Assignee: LeCroy Corporation (Chestnut Ridge, NY)
Inventors: David Graef (Campbell Hall, NY), Phil Stearns (Colorado Springs, CO), Norio Shimomura (Tokyo), Satoshi Hayasaka (Tokyo)
Primary Examiner: Antoine D. Davis
Attorney: Frommer Lawrence & Haug LLP
Application Number: 29/191,579
Classifications
Current U.S. Class: Oscilloscope Or Oscillograph (D10/76)