Measurement instrument

- LeCroy Corporation
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Description

FIG. 1 is a front elevational view of a first embodiment of the measurement instrument showing our new design;

FIG. 2 is a top plan view thereof;

FIG. 3 is a left side elevational view thereof;

FIG. 4 is a right side elevational view thereof;

FIG. 5 is a rear elevational view thereof; and,

FIG. 6 is a bottom plan view thereof.

The broken lines shown are for illustrative purposes only and forms no part of the claimed design.

Claims

The ornamental design for the “measurement instrument,” as shown.

Referenced Cited
U.S. Patent Documents
D282351 January 28, 1986 Nord et al.
4766425 August 23, 1988 Tallman et al.
4818931 April 4, 1989 Naegeli et al.
4821030 April 11, 1989 Batson et al.
4823283 April 18, 1989 Diehm et al.
5003249 March 26, 1991 Bird
D335093 April 27, 1993 Holmen et al.
5250935 October 5, 1993 Jonker et al.
D377319 January 14, 1997 Amano et al.
D423383 April 25, 2000 Fernandez et al.
6195617 February 27, 2001 Miller
6311138 October 30, 2001 Miller
6720776 April 13, 2004 Anderson et al.
20010001850 May 24, 2001 Miller
20030062906 April 3, 2003 Anderson et al.
20030191591 October 9, 2003 Iiyoshi et al.
20030204342 October 30, 2003 Law et al.
Patent History
Patent number: D504078
Type: Grant
Filed: Oct 9, 2003
Date of Patent: Apr 19, 2005
Assignee: LeCroy Corporation (Chestnut Ridge, NY)
Inventors: David Graef (Campbell Hall, NY), Phil Stearns (Colorado Springs, CO), Norio Shimomura (Tokyo), Satoshi Hayasaka (Tokyo)
Primary Examiner: Antoine D. Davis
Attorney: Frommer Lawrence & Haug LLP
Application Number: 29/191,578
Classifications
Current U.S. Class: Oscilloscope Or Oscillograph (D10/76)