Semiconductor element
Latest Sony Corporation Patents:
- Providing device, processing device, method for processing information, and program
- Image processing apparatus and method for skipping encoding of primary transform of residual and secondary transform
- IMAGE ENCODING DEVICE AND METHOD AND IMAGE DECODING DEVICE AND METHOD
- Method for identifying terminal capabilities in a wireless communication system
- Method, base station, terminal and communication system for updating component carrier
FIG. 1 is a perspective view of a first embodiment of a semiconductor element showing our new design;
FIG. 2 is a front elevational view thereof;
FIG. 3 is a rear elevational view thereof;
FIG. 4 is a left side elevational view thereof;
FIG. 5 is a right side elevational view thereof; and
FIG. 6 is a top plan view thereof.
FIG. 7 is a perspective view of a second embodiment of a semiconductor element showing our new design;
FIG. 8 is a front elevational view thereof;
FIG. 9 is a rear elevational view thereof;
FIG. 10 is a left side elevational view thereof;
FIG. 11 is a right side elevational view thereof; and
FIG. 12 is a top plan view thereof.
FIG. 13 is a perspective view of a third embodiment of a semiconductor element showing our new design;
FIG. 14 is a front elevational view thereof;
FIG. 15 is a rear elevational view thereof;
FIG. 16 is a left side elevational view thereof;
FIG. 17 is a right side elevational view thereof; and
FIG. 18 is a top plan view thereof.
FIG. 19 is a perspective view of a fourth embodiment of a semiconductor element showing our new design;
FIG. 20 is a front elevational view thereof;
FIG. 21 is a rear elevational view thereof;
FIG. 22 is a left side elevational view thereof;
FIG. 23 is a right side elevational view thereof; and
FIG. 24 is a top plan view thereof.
Lower part of the semiconductor element is opaque or transparent.
FIG. 25 is a perspective view of a fifth embodiment of a semiconductor element showing our new design;
FIG. 26 is a front elevational view thereof;
FIG. 27 is a rear elevational view thereof;
FIG. 28 is a left side elevational view thereof;
FIG. 29 is a right side elevational view thereof; and
FIG. 30 is a top plan view thereof.
Lower part of the semiconductor element is opaque or transparent.
FIG. 31 is a perspective view of a sixth embodiment of a semiconductor element showing our new design;
FIG. 32 is a front elevational view thereof;
FIG. 33 is a rear elevational view thereof;
FIG. 34 is a left side elevational view thereof;
FIG. 35 is a right side elevational view thereof; and,
FIG. 36 is a top plan view thereof.
Lower part of the semiconductor element is opaque or transparent.
The broken lines shown in the Figures are for illustrative purposes only and form no part of the claimed design. A bottom plan view in the first, second, third, fourth, fifth, and sixth embodiments is not part of the claimed design.
Claims
The ornamental design for a semiconductor element, as shown and described.
4685996 | August 11, 1987 | Busta et al. |
5536193 | July 16, 1996 | Kumar |
5580827 | December 3, 1996 | Akamine |
5923637 | July 13, 1999 | Shimada et al. |
5962958 | October 5, 1999 | Nakamoto |
6156215 | December 5, 2000 | Shimada et al. |
6229160 | May 8, 2001 | Krames et al. |
6323063 | November 27, 2001 | Krames et al. |
6337477 | January 8, 2002 | Shimada et al. |
D472529 | April 1, 2003 | Okuyama et al. |
D472531 | April 1, 2003 | Okuyama et al. |
D485242 | January 13, 2004 | Iwafuchi et al. |
6762543 | July 13, 2004 | Kang et al. |
2002-100805 | April 2002 | JP |
Type: Grant
Filed: Nov 13, 2003
Date of Patent: Jun 7, 2005
Assignee: Sony Corporation (Tokyo)
Inventors: Hiroyuki Okuyama (Tokyo), Masato Doi (Tokyo), Goshi Biwa (Tokyo), Toyoharu Oohata (Tokyo)
Primary Examiner: Stella Reid
Assistant Examiner: Selina Sikder
Attorney: Rader, Fishman & Grauer PLLC
Application Number: 29/193,675