Continuously profiled probe beam

- K&S Interconnect, Inc.
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Description

FIG. 1 shows the continuously profiled probe beam in profile direction.

FIG. 2 is a top view.

FIG. 3 is a side view.

FIG. 4 is an enlarged cross section view indicated in FIG. 1 by section line 4—4.

FIG. 5 is an enlarged cross section view indicated in FIG. 1 by section line 5—5; and,

FIG. 6 is an enlarged cross section view indicated in FIG. 1 by section line 6—6.

Claims

The ornamental design for a continuously profiled probe beam, as shown and described.

Referenced Cited
U.S. Patent Documents
6515496 February 4, 2003 Felici et al.
6530148 March 11, 2003 Kister
Patent History
Patent number: D510043
Type: Grant
Filed: Jun 11, 2003
Date of Patent: Sep 27, 2005
Assignee: K&S Interconnect, Inc. (Gilbert, AZ)
Inventor: January Kister (Redwood City, CA)
Primary Examiner: Antoine D. Davis
Attorney: Drinker Biddle & Reath LLP
Application Number: 29/183,540
Classifications