Transfer-chamber
Latest Tokyo Electron Limited Patents:
- Substrate processing monitoring apparatus based on imaging video data, substrate processing apparatus, substrate processing monitoring method, and storage medium
- Monitoring system for a sealing apparatus having a substrate treatment apparatus in a housing utilizing a laser sensor installed in a space between the housing and the substrate treatment apparatus and that scans a detection region therein
- Methods to provide uniform wet etching of material within high aspect ratio features provided on a patterned substrate
- Substrate holding method and substrate processing apparatus
- Systems for etching a substrate using a hybrid wet atomic layer etching process
The present article relates to a transfer-chamber of a multi-chamber type semiconductor substrate processing apparatus for a film forming process and other processes for semiconductor substrates and others to be processed. A plurality of process chambers are provided around the transfer-chamber so as to transfer the substrate received from a load-lock chamber to, through a loader-module shown in a reference drawing illustrating a state of usage of the transfer-chamber, the process chambers by means of a vacuum arm provided in the transfer-chamber.
FIG. 1 is a front elevational view of the transfer-chamber;
FIG. 2 is a back elevational view thereof;
FIG. 3 is a top view thereof;
FIG. 4 is a bottom view thereof;
FIG. 5 is a right side view thereof;
FIG. 6 is a left side view thereof;
FIG. 7 is 7—7 sectional view shown in FIG. 3.
FIG. 8 is 8—8 sectional view shown in FIG. 3.
FIG. 9 is 9—9 sectional view shown in FIG. 5.
FIG. 10 is a perspective view thereof; and,
FIG. 11 is a reference figure showing a bottom perspective view thereof.
Claims
The ornamental design for a transfer-chamber, as shown and described.
D436609 | January 23, 2001 | Tepman |
D446506 | August 14, 2001 | Tepman |
6440261 | August 27, 2002 | Tepman et al. |
20020134506 | September 26, 2002 | Franklin et al. |
Type: Grant
Filed: Nov 22, 2004
Date of Patent: Sep 5, 2006
Assignee: Tokyo Electron Limited (Tokyo)
Inventors: Keisuke Kondoh (Yamanashi), Hiroki Oka (Yamanashi), Hiroshi Narushima (Yamanashi)
Primary Examiner: Antoine D. Davis
Assistant Examiner: Patricia Palasik
Attorney: Smith, Gambrell & Russell, LLP
Application Number: 29/217,729