Three-dimensional measuring instrument

- Kabushiki Kaisha Topcon
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Description

The article is a three-dimensional measuring instrument for lands, structures, vehicles, aircrafts and the like, wherein a laser beam scans on the objects.

FIG. 1 is a perspective view of the instrument taken in front, right-side, upper direction of the three-dimensional measuring instrument;

FIG. 2 is a perspective view of the instrument taken in rear, left-side, upper direction of the instrument;

FIG. 3 is a front view of the instrument;

FIG. 4 is a rear view of the instrument;

FIG. 5 is a left-side view of the instrument;

FIG. 6 is a right-side view of the instrument;

FIG. 7 is a plan view of the instrument; and,

FIG. 8 is a bottom view of the instrument.

In the perspective views of FIGS. 1 and 2, sectioned narrow lines on ridge lines indicate a contour, not indicate patterns. Rectangles in the front view of FIG. 3 and the rear view of FIG. 4 are transparent.

Claims

The ornamental design for a three-dimensional measuring instrument, as shown.

Referenced Cited
U.S. Patent Documents
D504831 May 10, 2005 Snider
Patent History
Patent number: D563247
Type: Grant
Filed: Apr 30, 2007
Date of Patent: Mar 4, 2008
Assignee: Kabushiki Kaisha Topcon (Tokyo)
Inventor: Mitsuo Ishii (Tokyo)
Primary Examiner: Antoine D. Davis
Attorney: Jacobson Holman PLLC
Application Number: 29/274,516