Front panel for measurement instruments
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The ornamental design disclosed in this application is for various embodiments of a front panel for measurement instruments, such as oscilloscopes, logic analyzers, waveform generators, and the like.
The front panel has a substantially rectangular front face with a substantially rectangular opening disposed in a portion thereof, first beveled surfaces extending from side and top surfaces and from a first portion of a bottom surface to the rectangular front face, and a second beveled surface extending from a second portion of the bottom surface to the rectangular front face with the second beveled surface laterally transitioning from the first beveled surface.
Claims
The ornamental design of a front panel for measurement instruments, as shown and described.
Type: Grant
Filed: Feb 2, 2007
Date of Patent: Apr 22, 2008
Assignee: Tektronix, Inc. (Beaverton, OR)
Inventors: Michael D. Nelson (Seattle, WA), David K. Orr (Seattle, WA)
Primary Examiner: Antoine D. Davis
Attorney: William K. Bucher
Application Number: 29/276,752