Front panel for measurement instruments

- Tektronix, Inc.
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Description

The ornamental design disclosed in this application is for various embodiments of a front panel for measurement instruments, such as oscilloscopes, logic analyzers, waveform generators, and the like.

FIG. 1 is a perspective view of a first embodiment of front panel for measurement instruments;

FIG. 2 is a front elevation view of the first embodiment of front panel for measurement instruments;

FIG. 3 is a left side elevation view of the first embodiment of front panel for measurement instruments;

FIG. 4 is a right side elevation view of the first embodiment of front panel for measurement instruments;

FIG. 5 is a top plan view of the first embodiment of front panel for measurement instruments;

FIG. 6 is a bottom plan view of the first embodiment of front panel for measurement instruments;

FIG. 7 is a perspective view of a second embodiment of front panel for measurement instruments;

FIG. 8 is a front elevation view of the second embodiment of front panel for measurement instruments;

FIG. 9 is a left side elevation view of the second embodiment of front panel for measurement instruments;

FIG. 10 is a right side elevation view of the second embodiment of front panel for measurement instruments;

FIG. 11 is a top plan view of the second embodiment of front panel for measurement instruments;

FIG. 12 is a bottom plan view of the second embodiment of front panel for measurement instruments;

FIG. 13 is a perspective view of a third embodiment of front panel for measurement instruments;

FIG. 14 is a front elevation view of the third embodiment of front panel for measurement instruments;

FIG. 15 is a left side elevation view of the third embodiment of front panel for measurement instruments;

FIG. 16 is a right side elevation view of the third embodiment of front panel for measurement instruments;

FIG. 17 is a top plan view of the third embodiment of front panel for measurement instruments; and,

FIG. 18 is a bottom plan view of third embodiment of front panel for measurement instruments.

The front panel has a substantially rectangular front face with a substantially rectangular opening disposed in a portion thereof, first beveled surfaces extending from side and top surfaces and from a first portion of a bottom surface to the rectangular front face, and a second beveled surface extending from a second portion of the bottom surface to the rectangular front face with the second beveled surface laterally transitioning from the first beveled surface.

Claims

The ornamental design of a front panel for measurement instruments, as shown and described.

Referenced Cited
U.S. Patent Documents
D332833 January 26, 1993 Lauks et al.
D420607 February 15, 2000 Wrisley et al.
6140812 October 31, 2000 Russell et al.
6731104 May 4, 2004 Yang
D508426 August 16, 2005 Wrisley
6982550 January 3, 2006 Cannon
Patent History
Patent number: D567124
Type: Grant
Filed: Feb 2, 2007
Date of Patent: Apr 22, 2008
Assignee: Tektronix, Inc. (Beaverton, OR)
Inventors: Michael D. Nelson (Seattle, WA), David K. Orr (Seattle, WA)
Primary Examiner: Antoine D. Davis
Attorney: William K. Bucher
Application Number: 29/276,752