Electrical pin used in integrated circuit test sockets

- Johnstech International
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Description

FIG. 1 is a perspective view of the ornamental design for an electrical pin used in integrated circuit test sockets.

FIG. 2 is a side view thereof.

FIG. 3 is a back view thereof.

FIG. 4 is a perspective view thereof an alternate embodiment.

FIG. 5 is a side view of the subject matter of FIG. 4; and,

FIG. 6 is a bottom view thereof the subject matter of FIG. 4.

The broken line showing of structural features is included for the purpose of illustrating non-claimed subject matter and forms no part of the claimed design.

Claims

The ornamental design for an electrical pin used in integrated circuit test sockets, as shown and described.

Referenced Cited
U.S. Patent Documents
4823078 April 18, 1989 Mohebban
D351562 October 18, 1994 Moffatt et al.
5877618 March 2, 1999 Luebke et al.
D410203 May 25, 1999 Beha
D460702 July 23, 2002 Kaise
D471828 March 18, 2003 Huang
D500799 January 11, 2005 Olson
D501415 February 1, 2005 Seymour
D514963 February 14, 2006 Shionoiri et al.
D571240 June 17, 2008 Chun
D583266 December 23, 2008 Wong
Patent History
Patent number: D634228
Type: Grant
Filed: Nov 3, 2009
Date of Patent: Mar 15, 2011
Assignee: Johnstech International (Minneapolis, MN)
Inventors: John E. Steger (Richfield, MN), Russell F. Oberg (Beldenville, WI), Gary W. Michalko (Ham Lake, MN)
Primary Examiner: Antoine D Davis
Attorney: Altera Law Group, LLC
Application Number: 29/346,633
Classifications
Current U.S. Class: Provided With Handle, Or Hand-held (D10/78)