Controller for an electron microscope

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Description

FIG. 1 is a front, top and right side perspective view of a controller for an electron microscope showing our new design;

FIG. 2 is a front elevational view thereof;

FIG. 3 is a rear elevational view thereof;

FIG. 4 is a top plan view thereof;

FIG. 5 is a bottom plan view thereof;

FIG. 6 is a left side elevational view thereof; and,

FIG. 7 is a right side elevational view thereof.

Claims

The ornamental design for a controller for an electron microscope, as shown.

Referenced Cited
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Foreign Patent Documents
D1334659 June 2007 JP
Patent History
Patent number: D637638
Type: Grant
Filed: Jul 29, 2010
Date of Patent: May 10, 2011
Assignee: Hitachi High-Technologies Corporation (Tokyo)
Inventors: Hiroyuki Noda (Kokubunji), Mitsuru Oonuma (Tokyo), Akira Omachi (Komae), Masahiro Nemoto (Hitachiota), Kiyoshi Sasagawa (Honjo)
Primary Examiner: Paula Greene
Attorney: Antonelli, Terry, Stout & Kraus, LLP.
Application Number: 29/366,703
Classifications
Current U.S. Class: Optical Article Not Elsewhere Specified (D16/130)