Controller for an electron microscope

Skip to: Description  ·  Claims  ·  References Cited  · Patent History  ·  Patent History
Description

FIG. 1 is a front, top and right side perspective view of a controller for an electron microscope showing our new design;

FIG. 2 is a front elevational view thereof;

FIG. 3 is a rear elevational view thereof;

FIG. 4 is a top plan view thereof;

FIG. 5 is a bottom plan view thereof;

FIG. 6 is a left side elevational view thereof; and,

FIG. 7 is a right side elevational view thereof.

Claims

We claim the ornamental design for a controller for an electron microscope, as shown.

Referenced Cited
U.S. Patent Documents
4422105 December 20, 1983 Rodesch et al.
D291318 August 11, 1987 Kim
D292927 November 24, 1987 Burnstein et al.
4824229 April 25, 1989 Narita et al.
D320197 September 24, 1991 Weber
D325728 April 28, 1992 Mayo et al.
D330522 October 27, 1992 Mokhtarian
5237327 August 17, 1993 Saitoh et al.
D362695 September 26, 1995 Waldhelm
D377320 January 14, 1997 McGuire
5946131 August 31, 1999 Wells et al.
6118581 September 12, 2000 Domanik et al.
6148096 November 14, 2000 Pressman et al.
Foreign Patent Documents
D978141 March 1997 JP
Patent History
Patent number: D638045
Type: Grant
Filed: Jul 29, 2010
Date of Patent: May 17, 2011
Assignee: Hitachi High-Technologies Corporation (Tokyo)
Inventors: Hiroyuki Noda (Kokubunji), Mitsuru Oonuma (Tokyo), Akira Omachi (Komae), Masahiro Nemoto (Hitachiota), Kiyoshi Sasagawa (Honjo)
Primary Examiner: Paula Greene
Attorney: Antonelli, Terry, Stout & Kraus, LLP.
Application Number: 29/366,699
Classifications
Current U.S. Class: Optical Article Not Elsewhere Specified (D16/130)