Fixation device for a sample case for an electron microscope

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Description

FIG. 1 is a front, top and right side perspective view of a fixation device for a sample case for an electron microscope showing our new design;

FIG. 2 is a front elevational view thereof;

FIG. 3 is a rear elevational view thereof;

FIG. 4 is a top plan view thereof;

FIG. 5 is a bottom plan view thereof;

FIG. 6 is a left side elevational view thereof; and,

FIG. 7 is a right side elevational view thereof.

Claims

We claim the ornamental design for a fixation device for a sample case for an electron microscope, as shown.

Referenced Cited
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Patent History
Patent number: D660335
Type: Grant
Filed: Jan 31, 2011
Date of Patent: May 22, 2012
Assignee: Hitachi High-Technologies Corporation (Tokyo)
Inventors: Yasuhira Nagakubo (Hitachinaka), Toshiaki Tanigaki (Hitachinaka), Hideki Hirota (Hitachinaka), Takayuki Asakawa (Hitachinaka), Katsuji Itou (Hitachinaka)
Primary Examiner: Paula Greene
Attorney: Antonelli, Terry, Stout & Kraus, LLP.
Application Number: 29/384,357