Specimen analyzer
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Description
The broken lines shown represent unclaimed subject matter and form no part of the claimed design.
Claims
I claim the ornamental design for a specimen analyzer, as shown and described.
Referenced Cited
U.S. Patent Documents
D256726 | September 2, 1980 | Meuli et al. |
D378782 | April 8, 1997 | LaBarbera et al. |
D381756 | July 29, 1997 | Ohnuma et al. |
D467349 | December 17, 2002 | Niedbala et al. |
D474279 | May 6, 2003 | Mayer et al. |
D491272 | June 8, 2004 | Alden et al. |
D508999 | August 30, 2005 | Fanning et al. |
D612276 | March 23, 2010 | Duffy et al. |
D638545 | May 24, 2011 | Okawa et al. |
Patent History
Patent number: D670402
Type: Grant
Filed: Jan 19, 2012
Date of Patent: Nov 6, 2012
Assignee: Sysmex Corporation (Kobe)
Inventor: Fumie Shibata (Tokyo)
Primary Examiner: Anhdao Doan
Attorney: Brinks Hofer Gilson & Lione
Application Number: 29/411,301
Type: Grant
Filed: Jan 19, 2012
Date of Patent: Nov 6, 2012
Assignee: Sysmex Corporation (Kobe)
Inventor: Fumie Shibata (Tokyo)
Primary Examiner: Anhdao Doan
Attorney: Brinks Hofer Gilson & Lione
Application Number: 29/411,301
Classifications
Current U.S. Class:
Specimen Handling, Preparation Or Testing (62) (D24/216)