Specimen analyzer

- Sysmex Corporation
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Description

FIG. 1 is a front view of a specimen analyzer showing my new design;

FIG. 2 is a rear view thereof;

FIG. 3 is a right side view thereof;

FIG. 4 is a top plan view thereof;

FIG. 5 is a bottom plan view thereof; and,

FIG. 6 is a perspective view thereof.

The broken lines shown represent unclaimed subject matter and form no part of the claimed design.

Claims

I claim the ornamental design for a specimen analyzer, as shown and described.

Referenced Cited
U.S. Patent Documents
D256726 September 2, 1980 Meuli et al.
D378782 April 8, 1997 LaBarbera et al.
D381756 July 29, 1997 Ohnuma et al.
D467349 December 17, 2002 Niedbala et al.
D474279 May 6, 2003 Mayer et al.
D491272 June 8, 2004 Alden et al.
D508999 August 30, 2005 Fanning et al.
D612276 March 23, 2010 Duffy et al.
D638545 May 24, 2011 Okawa et al.
Patent History
Patent number: D670402
Type: Grant
Filed: Jan 19, 2012
Date of Patent: Nov 6, 2012
Assignee: Sysmex Corporation (Kobe)
Inventor: Fumie Shibata (Tokyo)
Primary Examiner: Anhdao Doan
Attorney: Brinks Hofer Gilson & Lione
Application Number: 29/411,301
Classifications
Current U.S. Class: Specimen Handling, Preparation Or Testing (62) (D24/216)