Analysis system
- Cepheid
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Description
The portions shown in broken lines form no part of the claimed design.
Claims
The ornamental design for an analysis system, as shown and described.
Referenced Cited
Patent History
Patent number: D705441
Type: Grant
Filed: May 2, 2013
Date of Patent: May 20, 2014
Assignee: Cepheid (Sunnyvale, CA)
Inventors: Ron Chang (Sunnyvale, CA), Steven M. Montgomery (Sunnyvale, CA), Gregory E. Mote (Sunnyvale, CA)
Primary Examiner: Anhdao Doan
Application Number: 29/453,806
Type: Grant
Filed: May 2, 2013
Date of Patent: May 20, 2014
Assignee: Cepheid (Sunnyvale, CA)
Inventors: Ron Chang (Sunnyvale, CA), Steven M. Montgomery (Sunnyvale, CA), Gregory E. Mote (Sunnyvale, CA)
Primary Examiner: Anhdao Doan
Application Number: 29/453,806
Classifications
Current U.S. Class:
Specimen Handling, Preparation Or Testing (62) (D24/216)