Specimen analyzer
Latest Sysmex Corporation Patents:
- SPECIMEN MEASUREMENT APPARATUS AND SPECIMEN TRANSPORT DEVICE
- OPTICAL SYSTEM AND SPECIMEN ANALYZER
- SPECIMEN MEASUREMENT APPARATUS AND SPECIMEN TRANSPORT DEVICE
- Sample preparation apparatus, sample preparation system, sample preparation method, and particle analyzer
- ION SENSOR, ION SENSOR MANUFACTURING METHOD, AND ION MEASUREMENT METHOD
Description
The broken lines in the drawing views are included for the purpose of illustrating portions of the specimen analyzer that form no part of the claimed design.
Claims
I claim the ornamental design for a specimen analyzer, as shown and described.
Referenced Cited
U.S. Patent Documents
D328794 | August 18, 1992 | Frenkel et al. |
D404140 | January 12, 1999 | Meguro |
D482796 | November 25, 2003 | Oyama et al. |
D588276 | March 10, 2009 | Isozaki et al. |
D637098 | May 3, 2011 | Oonuma et al. |
20090269841 | October 29, 2009 | Wojciechowski et al. |
20090325299 | December 31, 2009 | Hamada et al. |
20100210019 | August 19, 2010 | Kurono et al. |
Patent History
Patent number: D657068
Type: Grant
Filed: Dec 28, 2010
Date of Patent: Apr 3, 2012
Assignee: Sysmex Corporation (Kobe)
Inventor: Fumie Shibata (Tokyo)
Primary Examiner: Anhdao Doan
Attorney: Brinks Hofer Gilson & Lione
Application Number: 29/382,022
Type: Grant
Filed: Dec 28, 2010
Date of Patent: Apr 3, 2012
Assignee: Sysmex Corporation (Kobe)
Inventor: Fumie Shibata (Tokyo)
Primary Examiner: Anhdao Doan
Attorney: Brinks Hofer Gilson & Lione
Application Number: 29/382,022
Classifications
Current U.S. Class:
Specimen Handling, Preparation Or Testing (62) (D24/216)