Analysis system
- Cepheid
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Description
The portions shown in broken lines form no part of the claimed design.
Claims
The ornamental design for an analysis system, as shown and described.
Referenced Cited
Patent History
Patent number: D705944
Type: Grant
Filed: May 2, 2013
Date of Patent: May 27, 2014
Assignee: Cepheid (Sunnyvale, CA)
Inventors: Ron Chang (Sunnyvale, CA), Steven M. Montgomery (Sunnyvale, CA), Gregory E. Mote (Sunnyvale, CA)
Primary Examiner: Anhdao Doan
Application Number: 29/453,805
Type: Grant
Filed: May 2, 2013
Date of Patent: May 27, 2014
Assignee: Cepheid (Sunnyvale, CA)
Inventors: Ron Chang (Sunnyvale, CA), Steven M. Montgomery (Sunnyvale, CA), Gregory E. Mote (Sunnyvale, CA)
Primary Examiner: Anhdao Doan
Application Number: 29/453,805
Classifications
Current U.S. Class:
Specimen Handling, Preparation Or Testing (62) (D24/216)