Analysis system

- Cepheid
Skip to: Description  ·  Claims  ·  References Cited  · Patent History  ·  Patent History
Description

FIG. 1 is a front perspective view of an analysis system showing our new design;

FIG. 2 is a rear perspective view thereof;

FIG. 3 is a front elevational view thereof;

FIG. 4 is a rear elevational view thereof;

FIG. 5 is a top plan view thereof;

FIG. 6 is a bottom plan view thereof;

FIG. 7 is a left side elevational view thereof; and,

FIG. 8 is a right side elevational view thereof.

The portions shown in broken lines form no part of the claimed design.

Claims

The ornamental design for an analysis system, as shown and described.

Referenced Cited
U.S. Patent Documents
D356967 April 4, 1995 Takekoshi et al.
D599688 September 8, 2009 Ito
D638952 May 31, 2011 Oonuma et al.
D657068 April 3, 2012 Shibata
D681845 May 7, 2013 Matsuguma
D687561 August 6, 2013 Iseki
D689621 September 10, 2013 Morrow et al.
Patent History
Patent number: D705944
Type: Grant
Filed: May 2, 2013
Date of Patent: May 27, 2014
Assignee: Cepheid (Sunnyvale, CA)
Inventors: Ron Chang (Sunnyvale, CA), Steven M. Montgomery (Sunnyvale, CA), Gregory E. Mote (Sunnyvale, CA)
Primary Examiner: Anhdao Doan
Application Number: 29/453,805
Classifications