Articulating contact pin
Latest Johnstech International Corporation Patents:
- Contact assembly array and testing system having contact assembly array
- Over the air (OTA) chip testing system
- Contact assembly and kelvin testing system having contact assembly
- Compliant ground block and testing system having compliant ground block
- Compliant ground block and testing system having compliant ground block
The broken line in the figure drawing views is included for the purpose of illustrating environment and forms no part of the claimed design. The dash-dot line represents the boundary of the claimed design.
Claims
The ornamental design for a articulating contact pin, as shown and described.
Type: Grant
Filed: Jul 10, 2013
Date of Patent: Aug 26, 2014
Assignee: Johnstech International Corporation (Minneapolis, MN)
Inventors: David Johnson (Wayzata, MN), Sarosh Patel (Sunnyvale, CA), John E. Nelson (Brooklyn Park, MN)
Primary Examiner: Daniel Bui
Application Number: 29/460,414