Jig for measuring withstand voltage of semiconductor element
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The broken line showing is for illustrative purpose only and forms no part of the claimed design.
Claims
The ornamental design for a jig for measuring withstand voltage of semiconductor element, as shown and described.
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Type: Grant
Filed: Mar 15, 2013
Date of Patent: Nov 4, 2014
Assignee: Sumitomo Electric Industries, Ltd. (Osaka-shi)
Inventors: Misako Honaga (Osaka), Takeyoshi Masuda (Osaka)
Primary Examiner: Antoine D Davis
Application Number: 29/449,951