Jig for measuring withstand voltage of semiconductor element

Description

FIG. 1 is a front view of a first embodiment of the jig for measuring withstand voltage of semiconductor element, which has tapped holes used to hold a substrate provided with a semiconductor element and has a hollow to contain insulating liquid to submerge the substrate during measurement of a withstanding voltage of the element, showing our new design;

FIG. 2 is a rear view thereof;

FIG. 3 is a top plan view thereof;

FIG. 4 is a bottom plan view thereof;

FIG. 5 is a right side view thereof;

FIG. 6 is a left side view thereof;

FIG. 7 is a front perspective view thereof;

FIG. 8 is a sectional view taken along line 8-8 of FIG. 3 thereof;

FIG. 9 is a referential top plan view showing the state in use thereof; and,

FIG. 10 is a referential front perspective view showing the state in use thereof.

The broken line showing is for illustrative purpose only and forms no part of the claimed design.

Claims

The ornamental design for a jig for measuring withstand voltage of semiconductor element, as shown and described.