Micrometer

- MITUTOYO CORPORATION
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Description

FIG. 1 is a perspective view of a micrometer in a first embodiment;

FIG. 2 is a front view thereof;

FIG. 3 is a top view thereof;

FIG. 4 is a left side view thereof;

FIG. 5 is a right side view thereof;

FIG. 6 is a rear view thereof;

FIG. 7 is a bottom view thereof;

FIG. 8 is a second perspective view thereof;

FIG. 9 is a perspective view of the micrometer in a second embodiment;

FIG. 10 is a front view thereof;

FIG. 11 is a top view thereof;

FIG. 12 is a left side view thereof;

FIG. 13 is a right side view thereof;

FIG. 14 is a rear view thereof;

FIG. 15 is a bottom view thereof;

FIG. 16 is a second perspective view thereof;

FIG. 17 is a perspective view of the micrometer in a third embodiment;

FIG. 18 is a front view thereof;

FIG. 19 is a top view thereof;

FIG. 20 is a right side view thereof;

FIG. 21 is a left side view thereof;

FIG. 22 is a rear view thereof;

FIG. 23 is a bottom view thereof;

FIG. 24 is a second perspective view thereof;

FIG. 25 is a perspective view of the micrometer in a fourth embodiment;

FIG. 26 is a front view thereof;

FIG. 27 is a top view thereof;

FIG. 28 is a right side view thereof;

FIG. 29 is a left side view thereof;

FIG. 30 is a rear view thereof;

FIG. 31 is a bottom view thereof;

FIG. 32 is a second perspective view thereof;

FIG. 33 is an enlarged view of a portion of each embodiment; and,

FIG. 34 is a cross-sectional view taken through the enlarged portion seen in FIG. 33.

The broken lines depict environmental subject matter only and form no part of the claimed design.

Claims

The ornamental design for a micrometer, as shown and described.

Referenced Cited
U.S. Patent Documents
D268740 April 26, 1983 Tanada
D273468 April 17, 1984 Ueda et al.
D273469 April 17, 1984 Ueda et al.
4578868 April 1, 1986 Sasaki et al.
D429172 August 8, 2000 Reymond
6308433 October 30, 2001 Takahashi et al.
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7467480 December 23, 2008 Hayashida et al.
D611371 March 9, 2010 Ohtani et al.
8091251 January 10, 2012 Zhang et al.
8296966 October 30, 2012 Hayashida et al.
8413348 April 9, 2013 Tsuji
8739428 June 3, 2014 Emtman
Foreign Patent Documents
302042008 August 2012 CN
D701024 March 1987 JP
D1072314 June 2000 JP
D1189771 November 2003 JP
D1191546 December 2003 JP
D1267102 April 2006 JP
D1408521 February 2011 JP
Other references
  • Schut Geometrische Messtechnik GmbH 2002 Messzeuge und Messsysteme HD14023162, Oct. 31, 2002.
  • Mitutoyo Catalog No. 13 42 Measuring Instruments Catalog HC24008504, May 28, 2012.
Patent History
Patent number: D729659
Type: Grant
Filed: Feb 21, 2014
Date of Patent: May 19, 2015
Assignee: MITUTOYO CORPORATION (Kawasaki)
Inventors: Yoshiro Asano (Tokyo), Sadayuki Matsumiya (Kawasaki), Shigeru Ohtani (Kawasaki), Atsuya Niwano (Kawasaki), Shozaburo Tsuji (Kawasaki)
Primary Examiner: Antoine D Davis
Application Number: 29/482,736
Classifications