Micrometer
Latest MITUTOYO CORPORATION Patents:
- Metrology system with position and orientation tracking utilizing patterns of light beams
- Metrology system utilizing scan lens for points-from-focus type processes
- METHOD FOR AUTOMATICALLY GENERATING A REFERENCE POSITIONING SYSTEM, RPS, ALIGNMENT PROGRAM FOR SHAPE MEASUREMENT OF A WORKPIECE
- Displacement measuring apparatus
- MEASURING INSTRUMENT AND CONNECTION STRUCTURE
The broken lines depict environmental subject matter only and form no part of the claimed design.
Claims
The ornamental design for a micrometer, as shown and described.
| D268740 | April 26, 1983 | Tanada |
| D273468 | April 17, 1984 | Ueda et al. |
| D273469 | April 17, 1984 | Ueda et al. |
| 4578868 | April 1, 1986 | Sasaki et al. |
| D429172 | August 8, 2000 | Reymond |
| 6308433 | October 30, 2001 | Takahashi et al. |
| 6915591 | July 12, 2005 | Hayashida et al. |
| 7013576 | March 21, 2006 | Hayashida et al. |
| 7020979 | April 4, 2006 | Hayashida et al. |
| 7467480 | December 23, 2008 | Hayashida et al. |
| D611371 | March 9, 2010 | Ohtani et al. |
| 8091251 | January 10, 2012 | Zhang et al. |
| 8296966 | October 30, 2012 | Hayashida et al. |
| 8413348 | April 9, 2013 | Tsuji |
| 8739428 | June 3, 2014 | Emtman |
| 8833535 | September 16, 2014 | Saito et al. |
| 8997369 | April 7, 2015 | Jones |
| D730212 | May 26, 2015 | Biselx et al. |
| 302042008 | August 2012 | CN |
| D701024 | March 1987 | JP |
| D1072314 | June 2000 | JP |
| D1189771 | November 2003 | JP |
| D1191546 | December 2003 | JP |
| D1267102 | April 2006 | JP |
| D1408521 | February 2011 | JP |
- Schut Geometrische Messtechnik GmbH 2002 Messzeuge and Messsysteme HD14023162, Oct. 31, 2002.
- Mitutoyo Catalog No. 13 42 Measuring Instruments Catalog HC24008504, May 28, 2012.
Type: Grant
Filed: Jan 7, 2015
Date of Patent: Oct 6, 2015
Assignee: MITUTOYO CORPORATION (Kawasaki-shi)
Inventors: Yoshiro Asano (Tokyo), Sadayuki Matsumiya (Kawasaki), Shigeru Ohtani (Kawasaki), Atsuya Niwano (Kawasaki), Shozaburo Tsuji (Kawasaki)
Primary Examiner: Antoine D Davis
Application Number: 29/514,008