Optical measuring thedolite using light wave

- KABUSHIKI KAISHA TOPCON
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Description

FIG. 1 is a front elevational view of the optical measuring theodolite using light wave;

FIG. 2 is a rear elevational view thereof;

FIG. 3 is a left-side elevational view thereof;

FIG. 4 is a right-side elevational view thereof;

FIG. 5 is a top plan view thereof;

FIG. 6 is a bottom plan view thereof;

FIG. 7 is a front, right-side, top perspective view thereof; and,

FIG. 8 is a rear, left-side, top perspective view thereof.

The broken lines depict environmental subject matter only and form no part of the claimed design.

Claims

The ornamental design for an optical measuring theodolite using light wave, as shown and described.

Referenced Cited
U.S. Patent Documents
D453478 February 12, 2002 Ishii
D563247 March 4, 2008 Ishii
D723398 March 3, 2015 Ishii
Patent History
Patent number: D766753
Type: Grant
Filed: Jun 11, 2015
Date of Patent: Sep 20, 2016
Assignee: KABUSHIKI KAISHA TOPCON (Tokyo)
Inventors: Mitsuo Ishii (Tokyo), Takeo Aoki (Tokyo)
Primary Examiner: Antoine D Davis
Application Number: 29/529,894
Classifications
Current U.S. Class: Transit Or Theodolite (D10/66)