Optical measuring theodolite using light wave

- KABUSHIKI KAISHA TOPCON
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Description

FIG. 1 is a front elevational view of the optical measuring theodolite using light wave;

FIG. 2 is a rear elevational view thereof;

FIG. 3 is a left-side elevational view thereof;

FIG. 4 is a right-side elevational view thereof;

FIG. 5 is a top plan view thereof;

FIG. 6 is a bottom plan view thereof;

FIG. 7 is a front, right-side perspective view thereof; and,

FIG. 8 is a rear, left-side perspective view thereof.

The broken lines depict environmental subject matter only and form no part of the claimed design.

Claims

The ornamental design for an optical measuring theodolite using light wave, as shown and described.

Referenced Cited
U.S. Patent Documents
D684068 June 11, 2013 Ishii
D684069 June 11, 2013 Ishii
8897482 November 25, 2014 Mein
D723953 March 10, 2015 Ishii
Patent History
Patent number: D781730
Type: Grant
Filed: Nov 2, 2015
Date of Patent: Mar 21, 2017
Assignee: KABUSHIKI KAISHA TOPCON (Tokyo)
Inventors: Mitsuo Ishii (Tokyo), Satoshi Nakamura (Tokyo)
Primary Examiner: Antoine D Davis
Application Number: 29/544,296
Classifications
Current U.S. Class: Transit Or Theodolite (D10/66)