Substrate for spectroscopic analysis

- HAMAMATSU PHOTONICS K.K.
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Description

1. Substrate for spectroscopic analysis

1.1 : Perspective

1.2 : Front

1.3 : Back

1.4 : Top

1.5 : Bottom

1.6 : Left

1.7 : Right

1.8 : SECTIONAL VIEW

1.9 : SECTIONAL VIEW

1.10 : REFERENCE VIEW SHOWING THE STATE IN USE

Claims

The ornamental design for a substrate for spectroscopic analysis, as shown and described.

Referenced Cited
U.S. Patent Documents
3736042 May 1973 Markovits et al.
D273898 May 15, 1984 Valencia
D274261 June 12, 1984 Valencia
5784193 July 21, 1998 Ferguson
5812312 September 22, 1998 Lorincz
D407765 April 6, 1999 Zheng
D676497 February 19, 2013 Mimlitch, III
D683045 May 21, 2013 Domack
D692064 October 22, 2013 Kim
D702364 April 8, 2014 Iqbal et al.
D735877 August 4, 2015 Chang
D754871 April 26, 2016 Morrell-Falvey et al.
D788232 May 30, 2017 Koeberl
D808833 January 30, 2018 Abbott
D810207 February 13, 2018 Jasper
20050237607 October 27, 2005 Tenney
Other references
  • Office Action dated Mar. 6, 2018 in Design U.S. Appl. No. 35/502,701.
Patent History
Patent number: D825360
Type: Grant
Filed: Sep 30, 2016
Date of Patent: Aug 14, 2018
Assignee: HAMAMATSU PHOTONICS K.K. (Hamamatsu-shi, Shizuoka)
Inventors: Masashi Ito (Hamamatsu), Katsumi Shibayama (Hamamatsu), Kazuto Ofuji (Hamamatsu), Yoshihiro Maruyama (Hamamatsu), Mitsuhiro Ito (Hamamatsu), Toshiyuki Nagata (Hamamatsu), Hisashi Takamori (Hamamatsu)
Primary Examiner: George D. Kirschbaum
Application Number: 35/502,700
Classifications
Current U.S. Class: Chemical (12) (D10/81)