Mount for a medical instrument

- Carl Zeiss Meditec AG
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Description

FIG. 1 is a perspective view of a mount for a medical instrument according to our new design;

FIG. 2 is a front elevation view of the mount for a medical instrument of FIG. 1;

FIG. 3 is a rear elevation view of the mount for a medical instrument of FIG. 1;

FIG. 4 is a top elevation view of the mount for a medical instrument of FIG. 1;

FIG. 5 is a bottom elevation view of the mount for a medical instrument of FIG. 1;

FIG. 6 is a right side elevation view of the mount for a medical instrument of FIG. 1; and,

FIG. 7 is a left side elevation view of the mount for a medical instrument of FIG. 1.

The broken lines depict parts of the mount for a medical instrument that form no part of the claimed design.

Claims

The ornamental design for a mount for a medical instrument, as shown and described.

Referenced Cited
U.S. Patent Documents
D391638 March 3, 1998 Coons
D435107 December 12, 2000 Blair
D437639 February 13, 2001 Breda
D469182 January 21, 2003 Choi
D545963 July 3, 2007 Chami
D545967 July 3, 2007 Joyce
D566283 April 8, 2008 Brafford
7828252 November 9, 2010 Parsons
8555904 October 15, 2013 Lai
D708748 July 8, 2014 Lei
D713036 September 9, 2014 Sul
9033292 May 19, 2015 Lu
D796047 August 29, 2017 Janzen
Foreign Patent Documents
201430212134.0 June 2014 CN
Other references
  • Representation of Suspension System S7 in “OPMI PROergo Experience New Dimensions”, pp. 7, 10-15, 18; Carl Zeiss Meditec, Inc., Dublin, CA 94568, USA; DS-Nr.: 30-187/I-e/USA; publication year 2007.
  • Representation of Suspension System S100 in Time for a change: OPMI pico for ENT, pp. 5-7; Carl Zeiss Surgical GmbH, Oberkochen, Germany; 30-451/III-e; publication year 2005.
  • Representation of Suspension System in “OMS2350 Surgical Microscope for ENT” Zumax Medical Co., Ltd.,Suzhou, CN; publication year 2012, two pages.
Patent History
Patent number: D833005
Type: Grant
Filed: Aug 18, 2017
Date of Patent: Nov 6, 2018
Assignee: Carl Zeiss Meditec AG (Jena)
Inventors: Hai Li (Shanghai), Yongjie Zhao (Xinghua), Jinpeng Liu (Xi'an), Jianwei Shu (Hangzhou), Quanrong Gong (Shanghai)
Primary Examiner: David Muller
Application Number: 29/614,457
Classifications