Microscope
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Description
The broken lines depict parts of the microscope that form no part of the claimed design.
Claims
The ornamental design for a microscope, as shown and described.
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Patent History
Patent number: D862554
Type: Grant
Filed: Jun 28, 2018
Date of Patent: Oct 8, 2019
Assignee: Leica Microsystems CMS GmbH (Wetzlar)
Inventor: Christophe Apothéloz (Zurich)
Primary Examiner: Mark A Goodwin
Assistant Examiner: Benjamin M Weeks
Application Number: 29/654,961
Type: Grant
Filed: Jun 28, 2018
Date of Patent: Oct 8, 2019
Assignee: Leica Microsystems CMS GmbH (Wetzlar)
Inventor: Christophe Apothéloz (Zurich)
Primary Examiner: Mark A Goodwin
Assistant Examiner: Benjamin M Weeks
Application Number: 29/654,961
Classifications
Current U.S. Class:
Microscope (D16/131)