Remote controller
Latest Samsung Electronics Patents:
- Biorhythm determination method, and electronic device for supporting same
- Automatic data separation and placement for compressed data in a storage device
- Memory device, method of calibrating signal level thereof, and memory system having the same
- Electronic device and method for providing three-dimensional map
- Apparatus and method with image segmentation
The evenly spaced dashed broken lines in the figures depict portions of the remote controller that form no part of the claimed design. The dot-dash broken lines in
Claims
The ornamental design for a remote controller, as shown and described.
| D433675 | November 14, 2000 | Carranco |
| D451891 | December 11, 2001 | Noonan |
| D515041 | February 14, 2006 | Yun |
| D521459 | May 23, 2006 | Yun |
| D531585 | November 7, 2006 | Weitgasser |
| D542765 | May 15, 2007 | Cho |
| D546800 | July 17, 2007 | Lee |
| D555107 | November 13, 2007 | Choi |
| D563374 | March 4, 2008 | Jung |
| D564499 | March 18, 2008 | Ohta |
| D573548 | July 22, 2008 | Chouji |
| D584718 | January 13, 2009 | Moller |
| D607846 | January 12, 2010 | Daniels |
| D608305 | January 19, 2010 | Alexanderson |
| D609197 | February 2, 2010 | Koskela |
| D625693 | October 19, 2010 | Charleux |
| 7839627 | November 23, 2010 | Tanaka |
| D631871 | February 1, 2011 | Demskie |
| D657754 | April 17, 2012 | Kashimoto |
| D670658 | November 13, 2012 | Iliffe-Moon |
| D704165 | May 6, 2014 | Won |
| 20030095048 | May 22, 2003 | Choi |
| 20100033498 | February 11, 2010 | Terasaki |
| 303217554 | May 2015 | CN |
| 304280206 | September 2017 | CN |
| 300507060 | September 2008 | KR |
| 300881163 | November 2016 | KR |
- AmazonSmile: Samsung Smart Touch TV Remote, customer review 2017, https://smile.amazon.com/SAMSUNG-OEM-Original-Part-AA59-00781A/dp/B01CYOX . . . site visited Sep. 10, 2019 (Year: 2019).
Type: Grant
Filed: Apr 5, 2018
Date of Patent: Feb 4, 2020
Assignee: SAMSUNG ELECTRONICS CO., LTD. (Gyeonggi-Do)
Inventors: Taehan Kim (Seoul), Young-Sun Shin (Seoul)
Primary Examiner: Lilyana Bekic
Assistant Examiner: John R Yeh
Application Number: 29/643,209